{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9606065","patent":{"patent_number":"US-9606065","title":"Quantitative analysis method for measuring target element in specimen using laser-induced plasma spectrum","assignee":null,"inventors":[],"filing_date":"2013-12-12T00:00:00.000Z","publication_date":"2017-03-28T00:00:00.000Z","cpc_codes":["G01N"],"num_claims":7,"abstract":"Disclosed herein is a quantitative analysis method for measuring a target element in a specimen using laser-induced plasma spectrum. More particularly, the present invention relates to a method for analyzing a composition ratio of a target element by calculating peak intensities when peaks overlap each other in a spectrum, and a method for selecting a peak of a wavelength at which the highest precision and reproducibility are secured through linearity of a correlation plot of the peak intensities and a value by dividing a standard deviation value of calibration curve data (peak intensity ratios) by a slope when an internal standard method is used for quantitative analysis of a target element."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Quantitative analysis method for measuring target element in specimen using laser-induced plasma spectrum","description":"Disclosed herein is a quantitative analysis method for measuring a target element in a specimen using laser-induced plasma spectrum. More particularly, the present invention relates to a method for an","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9606065","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9606065","citation_suggestion":"Patentable. \"Quantitative analysis method for measuring target element in specimen using laser-induced plasma spectrum\" (US-9606065). https://patentable.app/patents/US-9606065","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9606065","json":"https://patentable.app/api/llm-context/US-9606065","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T09:15:01.405Z"}