{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9606235","patent":{"patent_number":"US-9606235","title":"Laser metrology system and method","assignee":null,"inventors":[],"filing_date":"2014-01-16T00:00:00.000Z","publication_date":"2017-03-28T00:00:00.000Z","cpc_codes":["G01S","G01C"],"num_claims":20,"abstract":"A laser metrology system may include a modulated measurement beam, a beam splitter for splitting the measurement beam into a local oscillator beam and a transmitted beam, an optical assembly for projecting the transmitted beam to a measured area on a surface of a target structure and for receiving a reflected beam from the measured area, a beam combiner for combining the reflected beam and the local oscillator beam into a detection beam, a detector for processing the detection beam, the detector including a micro-lens for projecting the detection beam, a photodetector for carrying out coherent detection of the detection beam and detector electronics in communication with the photodetector for generating informational data from the detection beam, and a range processor for computing dimensional data about the measured area from the informational data."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Laser metrology system and method","description":"A laser metrology system may include a modulated measurement beam, a beam splitter for splitting the measurement beam into a local oscillator beam and a transmitted beam, an optical assembly for proje","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9606235","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9606235","citation_suggestion":"Patentable. \"Laser metrology system and method\" (US-9606235). https://patentable.app/patents/US-9606235","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9606235","json":"https://patentable.app/api/llm-context/US-9606235","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T08:02:46.652Z"}