{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9606882","patent":{"patent_number":"US-9606882","title":"Methods and systems for die failure testing","assignee":null,"inventors":[],"filing_date":"2015-01-13T00:00:00.000Z","publication_date":"2017-03-28T00:00:00.000Z","cpc_codes":["G06F","G11C","G11C","G06F","G06F"],"num_claims":24,"abstract":"The disclosed method includes, at a storage controller of a storage system, receiving host instructions to modify configuration settings corresponding to a first memory portion of a plurality of memory portions. The method includes, in response to receiving the host instructions to modify the configuration settings, identifying the first memory portion from the host instructions and modifying the configuration settings corresponding to the first memory portion, in accordance with the host instructions. The method includes, after modifying the configuration settings corresponding to the first memory portion, sending one or more commands to perform memory operations having one or more physical addresses corresponding to the first memory portion and receiving a failure notification indicating failed performance of at least a first memory operation of the one or more memory operations. The method includes, in response to receiving the failure notification, executing one or more error recovery mechanisms."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Methods and systems for die failure testing","description":"The disclosed method includes, at a storage controller of a storage system, receiving host instructions to modify configuration settings corresponding to a first memory portion of a plurality of memor","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9606882","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9606882","citation_suggestion":"Patentable. \"Methods and systems for die failure testing\" (US-9606882). https://patentable.app/patents/US-9606882","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9606882","json":"https://patentable.app/api/llm-context/US-9606882","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T03:51:17.495Z"}