{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9626267","patent":{"patent_number":"US-9626267","title":"Test generation using expected mode of the target hardware device","assignee":null,"inventors":[],"filing_date":"2015-01-30T00:00:00.000Z","publication_date":"2017-04-18T00:00:00.000Z","cpc_codes":["G06F"],"num_claims":20,"abstract":"A method, apparatus and product for test generation. The method comprises generating a first set of instructions for a hardware component, that are to be executed when operating in a first mode of operation; in response to a parsed template statement being a marker statement, generating an intermediary set of one or more instructions to cause the hardware component to change the mode of operation to a second mode in accordance with the marker instruction, and modifying the expected mode of the hardware component to a second mode; and generating a second set of instructions for the hardware component, that are to be executed when operating in the second mode of operation. The generation of instructions comprises determining the expected mode and generating instructions in accordance with the expected mode of the hardware component. The generation is performed without having an expected full state of the hardware component."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Test generation using expected mode of the target hardware device","description":"A method, apparatus and product for test generation. The method comprises generating a first set of instructions for a hardware component, that are to be executed when operating in a first mode of ope","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9626267","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9626267","citation_suggestion":"Patentable. \"Test generation using expected mode of the target hardware device\" (US-9626267). https://patentable.app/patents/US-9626267","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9626267","json":"https://patentable.app/api/llm-context/US-9626267","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T09:31:49.341Z"}