{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9633747","patent":{"patent_number":"US-9633747","title":"Semiconductor memory devices and methods of testing open failures thereof","assignee":null,"inventors":[],"filing_date":"2013-03-18T00:00:00.000Z","publication_date":"2017-04-25T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C","G11C","G11C","G11C"],"num_claims":17,"abstract":"Semiconductor memory devices are provided. The semiconductor memory device includes an input/output (I/O) drive controller, a data I/O unit and a data transmitter. The data I/O unit selectively drives a first global I/O line and first/second global I/O lines according to the first or second test modes. The data transmitter selectively transfers the data on the first global I/O line onto first and second local I/O lines to store the data on the first global I/O line, and the data on the first and second global I/O lines onto the first and second local I/O lines according to the first or second test modes."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor memory devices and methods of testing open failures thereof","description":"Semiconductor memory devices are provided. The semiconductor memory device includes an input/output (I/O) drive controller, a data I/O unit and a data transmitter. The data I/O unit selectively drives","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9633747","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9633747","citation_suggestion":"Patentable. \"Semiconductor memory devices and methods of testing open failures thereof\" (US-9633747). https://patentable.app/patents/US-9633747","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9633747","json":"https://patentable.app/api/llm-context/US-9633747","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T16:52:33.001Z"}