{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9633925","patent":{"patent_number":"US-9633925","title":"Visualization of alignment marks on a chip covered by a pre-applied underfill","assignee":null,"inventors":[],"filing_date":"2016-03-25T00:00:00.000Z","publication_date":"2017-04-25T00:00:00.000Z","cpc_codes":["H01L","H01L","H01L","H01L","H01L","H01L"],"num_claims":20,"abstract":"Structures and methods for improving the visualization of alignment marks on an underfill-covered chip. A feature is formed on a chip, and an underfill material is applied to the chip at a wafer level so that the feature is covered the feature. The feature includes a first structural element comprised of a first material and a second structural element comprised of a second material that is electrochemically dissimilar from the first material to provide a galvanic cell effect. Filler particles in the underfill material are caused by the galvanic cell effect to distribute with a first density in a first region over the first structural element and a second region of a second density over the second structural element. The first density in the first region is less than the second density in the second region such that the first region has a lower opacity than the second region."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Visualization of alignment marks on a chip covered by a pre-applied underfill","description":"Structures and methods for improving the visualization of alignment marks on an underfill-covered chip. A feature is formed on a chip, and an underfill material is applied to the chip at a wafer level","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9633925","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9633925","citation_suggestion":"Patentable. \"Visualization of alignment marks on a chip covered by a pre-applied underfill\" (US-9633925). https://patentable.app/patents/US-9633925","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9633925","json":"https://patentable.app/api/llm-context/US-9633925","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T05:18:04.114Z"}