{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9641700","patent":{"patent_number":"US-9641700","title":"Method for automatically selecting test parameters of an image inspection system and image inspection system for implementing the method","assignee":null,"inventors":[],"filing_date":"2015-03-31T00:00:00.000Z","publication_date":"2017-05-02T00:00:00.000Z","cpc_codes":["H04N","G06T","G06T","H04N","H04N","H04N","G06T","G06T","G06T","G06T"],"num_claims":8,"abstract":"A method for automatically selecting test parameters for an image inspection system using a computer, includes digitizing a reference image or a scanned printed image to determine target values, categorizing the image elements that are present, determining tolerances for the target values based on the categorization, calculating the inspection sensitivity based on target values and the respective tolerances thereof, setting the parameters of the image inspection system based on the inspection sensitivity, and configuring the image inspection using these parameters. An image inspection system for implementing the method is also provided."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for automatically selecting test parameters of an image inspection system and image inspection system for implementing the method","description":"A method for automatically selecting test parameters for an image inspection system using a computer, includes digitizing a reference image or a scanned printed image to determine target values, categ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9641700","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9641700","citation_suggestion":"Patentable. \"Method for automatically selecting test parameters of an image inspection system and image inspection system for implementing the method\" (US-9641700). https://patentable.app/patents/US-9641700","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9641700","json":"https://patentable.app/api/llm-context/US-9641700","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T08:04:47.317Z"}