{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9646900","patent":{"patent_number":"US-9646900","title":"Programmable addressable test chip","assignee":null,"inventors":[],"filing_date":"2015-01-24T00:00:00.000Z","publication_date":"2017-05-09T00:00:00.000Z","cpc_codes":["H01L","H01L","H01L"],"num_claims":18,"abstract":"A programmable test chip includes a target chip to be tested and addressing circuits fabricated on the same wafer. The addressing circuits can be placed in the scribe lines or a pre-allocated area of the wafer. When testing the target chip, a circuit connecting the target chip and the addressing circuits can be fabricated on demand. In some cases the target chip is not connected to the addressing circuits, and a DUT array exists in a scribe line having a connecting circuit prefabricated between the addressing circuits with the DUT array for testing the DUT array in the scribe line. When the need for testing the target chip arises, the prefabricated connecting circuit can be cut, and the connecting circuit connecting the target chip and the addressing circuits can be fabricated. Based on results from such test chips, the manufacturing process can be better studied."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Programmable addressable test chip","description":"A programmable test chip includes a target chip to be tested and addressing circuits fabricated on the same wafer. The addressing circuits can be placed in the scribe lines or a pre-allocated area of ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9646900","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9646900","citation_suggestion":"Patentable. \"Programmable addressable test chip\" (US-9646900). https://patentable.app/patents/US-9646900","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9646900","json":"https://patentable.app/api/llm-context/US-9646900","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T06:10:29.011Z"}