{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9651609","patent":{"patent_number":"US-9651609","title":"Semiconductor circuit having test function","assignee":null,"inventors":[],"filing_date":"2014-11-11T00:00:00.000Z","publication_date":"2017-05-16T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C"],"num_claims":8,"abstract":"A semiconductor circuit having a test function includes: a first circuit block including a circuit for performing a main function of the semiconductor circuit; a first power control block for controlling supply of power to the first circuit block; a second circuit block including a circuit for performing a function of testing the semiconductor circuit; and a second power control block for controlling supply of power to the second circuit block. The semiconductor circuit is operable in a first power mode in which a first pad is supplied with a supply voltage and a second pad is grounded, or in a second power mode in which the second pad is supplied with the supply voltage and the first pad is grounded. The second power control block is implemented as a diode."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor circuit having test function","description":"A semiconductor circuit having a test function includes: a first circuit block including a circuit for performing a main function of the semiconductor circuit; a first power control block for controll","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9651609","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9651609","citation_suggestion":"Patentable. \"Semiconductor circuit having test function\" (US-9651609). https://patentable.app/patents/US-9651609","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9651609","json":"https://patentable.app/api/llm-context/US-9651609","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T12:37:07.690Z"}