{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9653260","patent":{"patent_number":"US-9653260","title":"High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella","assignee":null,"inventors":[],"filing_date":"2012-11-30T00:00:00.000Z","publication_date":"2017-05-16T00:00:00.000Z","cpc_codes":["G01N"],"num_claims":26,"abstract":"A method for TEM sample preparation and analysis that can be used in a FIB-SEM system without re-welds, unloads, user handling of the lamella, or a motorized flip stage. The method allows a dual beam FIB-SEM system with a typical tilt stage to be used to extract a sample to from a substrate, mount the sample onto a TEM sample holder capable of tilting, thin the sample using FIB milling, and rotate the sample so that the sample face is perpendicular to an electron column for STEM imaging."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella","description":"A method for TEM sample preparation and analysis that can be used in a FIB-SEM system without re-welds, unloads, user handling of the lamella, or a motorized flip stage. The method allows a dual beam ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9653260","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9653260","citation_suggestion":"Patentable. \"High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella\" (US-9653260). https://patentable.app/patents/US-9653260","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9653260","json":"https://patentable.app/api/llm-context/US-9653260","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T15:33:44.624Z"}