{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9658128","patent":{"patent_number":"US-9658128","title":"Defect inspection method","assignee":null,"inventors":[],"filing_date":"2016-01-29T00:00:00.000Z","publication_date":"2017-05-23T00:00:00.000Z","cpc_codes":["G01N"],"num_claims":7,"abstract":"A defect inspection method according to an embodiment has: exposing a target object to a tracer having higher absorptance for a neutron ray than the target object; radiating the neutron ray to the target object exposed to the tracer; generating at least one neutron image based on the neutron ray having penetrated the target object exposed to the tracer; and detecting a defect of the target object based on the generated at least one neutron image."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Defect inspection method","description":"A defect inspection method according to an embodiment has: exposing a target object to a tracer having higher absorptance for a neutron ray than the target object; radiating the neutron ray to the tar","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9658128","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9658128","citation_suggestion":"Patentable. \"Defect inspection method\" (US-9658128). https://patentable.app/patents/US-9658128","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9658128","json":"https://patentable.app/api/llm-context/US-9658128","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T06:57:52.009Z"}