{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9658284","patent":{"patent_number":"US-9658284","title":"Method for forming a test pad and method for performing array test using the test pad","assignee":null,"inventors":[],"filing_date":"2015-01-06T00:00:00.000Z","publication_date":"2017-05-23T00:00:00.000Z","cpc_codes":["H01L","H01L","H01L"],"num_claims":13,"abstract":"The disclosure is related to a method for forming a test pad between adjacent transistors regions, comprising forming a plurality of transistor regions in an array on a glass substrate, wherein each of the transistor region comprises a first transistor region and a second transistor region arranged oppositely; and forming a plurality of test pads between the first transistor region and the second transistor region. The disclosure is further related to a method for array test on the adjacent transistor regions using the test pad formed by the above method. A common test pad formed between the adjacent transistor regions of each transistor region group is employed by the disclosure to perform array test on the adjacent transistor regions. Thus the size of the adjacent fringe region of each transistor region may be reduced to facilitate achieving narrow frame of a display."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for forming a test pad and method for performing array test using the test pad","description":"The disclosure is related to a method for forming a test pad between adjacent transistors regions, comprising forming a plurality of transistor regions in an array on a glass substrate, wherein each o","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9658284","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9658284","citation_suggestion":"Patentable. \"Method for forming a test pad and method for performing array test using the test pad\" (US-9658284). https://patentable.app/patents/US-9658284","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9658284","json":"https://patentable.app/api/llm-context/US-9658284","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T09:51:24.558Z"}