{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9658947","patent":{"patent_number":"US-9658947","title":"Method for ranking fault-test pairs based on waveform statistics in a mutation-based test program evaluation system","assignee":null,"inventors":[],"filing_date":"2013-02-15T00:00:00.000Z","publication_date":"2017-05-23T00:00:00.000Z","cpc_codes":["G06F"],"num_claims":28,"abstract":"Ranking of fault-test pairs is performed using first and second multitudes of waveform statistics. The first multitude of waveform statistics includes first value-change information regarding variations in logics HIGH and LOW for each bit of each reference output resulting from a test run of the design code. The second multitude of waveform statistics includes second value-change information regarding variations in logics HIGH and LOW for each bit of each faulty output resulting from a test run of the design code injected with a fault. Relative differences between the first and second multitudes of waveform statistics for each bit of each faulty output with respect to the corresponding reference output are determined. A waveform difference based on the relative differences for each signal of each faulty output is determined. A ranking result of fault-test pairs is determined according to the waveform differences of the faulty outputs."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for ranking fault-test pairs based on waveform statistics in a mutation-based test program evaluation system","description":"Ranking of fault-test pairs is performed using first and second multitudes of waveform statistics. The first multitude of waveform statistics includes first value-change information regarding variatio","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9658947","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9658947","citation_suggestion":"Patentable. \"Method for ranking fault-test pairs based on waveform statistics in a mutation-based test program evaluation system\" (US-9658947). https://patentable.app/patents/US-9658947","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9658947","json":"https://patentable.app/api/llm-context/US-9658947","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T06:45:57.663Z"}