{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9664614","patent":{"patent_number":"US-9664614","title":"Method for high resolution sum-frequency generation and infrared microscopy","assignee":null,"inventors":[],"filing_date":"2012-07-10T00:00:00.000Z","publication_date":"2017-05-30T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N"],"num_claims":20,"abstract":"A method for analyzing a sample with a light probe with a spatial resolution smaller than the wavelength of the light probe comprising the steps of: —illuminating the sample by a first light pulse saturating a vibrational and/or electronic transition, said light pulse presenting an intensity spatial distribution on the sample presenting at least one minimum wherein saturation does not occur, —measuring the local absorbance properties and/or the local second order non-linear susceptibility of the sample by using a second light pulse forming the light probe at a wavelength corresponding to said electronic and/or vibrational transition, wherein the second light pulse overlap said first light pulse intensity minimum."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for high resolution sum-frequency generation and infrared microscopy","description":"A method for analyzing a sample with a light probe with a spatial resolution smaller than the wavelength of the light probe comprising the steps of: —illuminating the sample by a first light pulse sat","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9664614","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9664614","citation_suggestion":"Patentable. \"Method for high resolution sum-frequency generation and infrared microscopy\" (US-9664614). https://patentable.app/patents/US-9664614","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9664614","json":"https://patentable.app/api/llm-context/US-9664614","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T07:18:50.570Z"}