{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9678146","patent":{"patent_number":"US-9678146","title":"Temperature insensitive testing device and method","assignee":null,"inventors":[],"filing_date":"2014-11-03T00:00:00.000Z","publication_date":"2017-06-13T00:00:00.000Z","cpc_codes":["H04L"],"num_claims":13,"abstract":"The present invention discloses a temperature insensitive testing device comprising: a transmission-end test sequence generating circuit to generate a test sequence; a transmission circuit to process the test sequence according to a transmission clock and thereby generate a test signal; a reception circuit to process an echo of the test signal and generate a digital echo signal; a correlation-value generating circuit to generate correlation values including a maximum correlation value according to the test sequence and the digital echo signal; and a decision circuit to determine whether a relation between the maximum correlation value and at least one threshold satisfies a predetermined condition and thereby generate a decision result, wherein the frequency of the transmission clock is lower than a predetermined frequency which confines the variation of the maximum correlation value to a predetermined range provided that the temperature variation of the transmission cable is within a temperature variation range."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Temperature insensitive testing device and method","description":"The present invention discloses a temperature insensitive testing device comprising: a transmission-end test sequence generating circuit to generate a test sequence; a transmission circuit to process ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9678146","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9678146","citation_suggestion":"Patentable. \"Temperature insensitive testing device and method\" (US-9678146). https://patentable.app/patents/US-9678146","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9678146","json":"https://patentable.app/api/llm-context/US-9678146","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T06:10:18.613Z"}