{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9684025","patent":{"patent_number":"US-9684025","title":"DUT continuity test with only digital IO structures apparatus and methods associated thereof","assignee":null,"inventors":[],"filing_date":"2014-11-26T00:00:00.000Z","publication_date":"2017-06-20T00:00:00.000Z","cpc_codes":["G05B","G06F","G05B"],"num_claims":5,"abstract":"A method and system for determining short, open, and good connections using digital input and output (IO) structures in a device under test (DUT) continuity test, through the combined methods of using resistance-capacitance (RC) delay, time domain reflectometry (TDR), and forcing voltage on to a single IO pin of the DUT while measuring voltage on remaining IO pins of said DUT. In one embodiment, the combined methods are executed without the DUT in a test socket to produce a first set of test values and also with the DUT in a test socket to produce a second set of test values. The first and second sets of test values are compared to determine if one or more circuits of the DUT have a short circuit, an open circuit, or are a good (have an electrical connection that is not a short circuit or an open circuit) circuit."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"DUT continuity test with only digital IO structures apparatus and methods associated thereof","description":"A method and system for determining short, open, and good connections using digital input and output (IO) structures in a device under test (DUT) continuity test, through the combined methods of using","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9684025","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9684025","citation_suggestion":"Patentable. \"DUT continuity test with only digital IO structures apparatus and methods associated thereof\" (US-9684025). https://patentable.app/patents/US-9684025","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9684025","json":"https://patentable.app/api/llm-context/US-9684025","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T06:08:30.367Z"}