{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9684579","patent":{"patent_number":"US-9684579","title":"Test device selection using multi-pass scoring","assignee":null,"inventors":[],"filing_date":"2014-12-05T00:00:00.000Z","publication_date":"2017-06-20T00:00:00.000Z","cpc_codes":["G06F","G06F"],"num_claims":20,"abstract":"A method for selecting test devices in a service provider environment may include receiving a request for performing a test on a device, the request specifying at least one parameter for the test. A list of available devices may be obtained. The list of available devices may be filtered to generate a list of candidate hardware devices that meet the at least one parameter for the test. Using a first set of operations, current state information for each of the candidate devices may be obtained. Using a second set of operations, at least one weight may be assigned to the current state information to generate weighted state information for each of the candidate devices. Device scores may be generated using the weighted state information. Based on the scores, one of the candidate devices may be selected for performing the test."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Test device selection using multi-pass scoring","description":"A method for selecting test devices in a service provider environment may include receiving a request for performing a test on a device, the request specifying at least one parameter for the test. A l","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9684579","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9684579","citation_suggestion":"Patentable. \"Test device selection using multi-pass scoring\" (US-9684579). https://patentable.app/patents/US-9684579","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9684579","json":"https://patentable.app/api/llm-context/US-9684579","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T10:12:14.587Z"}