{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9690187","patent":{"patent_number":"US-9690187","title":"Sampling for OPC model building","assignee":null,"inventors":[],"filing_date":"2015-04-03T00:00:00.000Z","publication_date":"2017-06-27T00:00:00.000Z","cpc_codes":["G06F","G06F","G06F","G06F"],"num_claims":8,"abstract":"Methods for selecting the best measurement sites for OPC model calibration are disclosed. Embodiments include selecting a predetermined number, n, of structures representing an IC design layout eligible for SEM measurement; specifying an image parameter space of image parameters for the n structures; optimizing a redundancy in the image parameter space of measurement sites for the n structures; and calibrating an OPC model for the IC design layout based on the optimized redundancy."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Sampling for OPC model building","description":"Methods for selecting the best measurement sites for OPC model calibration are disclosed. Embodiments include selecting a predetermined number, n, of structures representing an IC design layout eligib","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9690187","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9690187","citation_suggestion":"Patentable. \"Sampling for OPC model building\" (US-9690187). https://patentable.app/patents/US-9690187","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9690187","json":"https://patentable.app/api/llm-context/US-9690187","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T08:49:25.241Z"}