{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9715942","patent":{"patent_number":"US-9715942","title":"Built-in self-test (BIST) circuit and associated BIST method for embedded memories","assignee":null,"inventors":[],"filing_date":"2015-06-09T00:00:00.000Z","publication_date":"2017-07-25T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C"],"num_claims":20,"abstract":"Disclosed is a chip with a built-in self-test (BIST) circuit that incorporates a BIST engine that tests memories in parallel and that, prior to testing, dynamically sets the size of the address space to be swept. The BIST engine comprises an address generator that determines a superset of address space values associated with all the memories. This superset indicates the highest number of banks, the highest number of word lines per bank and the highest decode number for any of the memories. The address generator then generates test addresses and does so such that all test addresses are within a composite address space defined by the superset and, thereby within an address space that may, depending upon the memory configurations, be less than the predetermined maximum address space associated with such memories so as to reduce test time. Also disclosed is an associated BIST method for testing memories."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Built-in self-test (BIST) circuit and associated BIST method for embedded memories","description":"Disclosed is a chip with a built-in self-test (BIST) circuit that incorporates a BIST engine that tests memories in parallel and that, prior to testing, dynamically sets the size of the address space ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9715942","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9715942","citation_suggestion":"Patentable. \"Built-in self-test (BIST) circuit and associated BIST method for embedded memories\" (US-9715942). https://patentable.app/patents/US-9715942","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9715942","json":"https://patentable.app/api/llm-context/US-9715942","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T06:25:19.427Z"}