{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9728624","patent":{"patent_number":"US-9728624","title":"Semiconductor testing devices","assignee":null,"inventors":[],"filing_date":"2015-10-28T00:00:00.000Z","publication_date":"2017-08-08T00:00:00.000Z","cpc_codes":["H01L","H01L"],"num_claims":20,"abstract":"A method for fabricating a test structure on a wafer includes forming a fin on a substrate, forming a first gate stack over the fin, the first gate stack having a first gate width, the first gate stack including a gate dielectric layer having a first thickness, forming a second gate stack over the fin, the second gate stack having a second gate width, the second gate stack including a gate dielectric layer having a second thickness, and forming a third gate stack over the fin, the third gate stack having a third gate width, the third gate stack including a gate dielectric layer having the second thickness, wherein the first gate stack is arranged a first distance from the second gate stack and the second gate stack is arranged the first distance from the third gate stack."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor testing devices","description":"A method for fabricating a test structure on a wafer includes forming a fin on a substrate, forming a first gate stack over the fin, the first gate stack having a first gate width, the first gate stac","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9728624","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9728624","citation_suggestion":"Patentable. \"Semiconductor testing devices\" (US-9728624). https://patentable.app/patents/US-9728624","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9728624","json":"https://patentable.app/api/llm-context/US-9728624","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T09:51:18.042Z"}