{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9733063","patent":{"patent_number":"US-9733063","title":"Method and device for determining optical properties by simultaneous measurement of intensities at thin layers using light of several wavelengths","assignee":null,"inventors":[],"filing_date":"2011-01-31T00:00:00.000Z","publication_date":"2017-08-15T00:00:00.000Z","cpc_codes":["G01N","G01N"],"num_claims":12,"abstract":"In a method for determining optical properties by measuring intensities at a thin layer, light is directed into the thin layer and passes through a beam splitter, which directs a first part of the light onto the thin layer and a second part of the light onto a reference detector. Interference of the first part of the light in the thin layer is detected via a high-resolution detector and forwarded to an evaluating unit, which determines the reflection and/or transmission coefficients, which are correlated with the optical layer thickness through a comparison using at least one database stored in the evaluating unit. The optical layer thickness is obtained as a gray value modification by way of a gray scale value analysis and a conversion factor stored in the at least one data base. A corresponding device and intended uses of the method and device are also described."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and device for determining optical properties by simultaneous measurement of intensities at thin layers using light of several wavelengths","description":"In a method for determining optical properties by measuring intensities at a thin layer, light is directed into the thin layer and passes through a beam splitter, which directs a first part of the lig","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9733063","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9733063","citation_suggestion":"Patentable. \"Method and device for determining optical properties by simultaneous measurement of intensities at thin layers using light of several wavelengths\" (US-9733063). https://patentable.app/patents/US-9733063","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9733063","json":"https://patentable.app/api/llm-context/US-9733063","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T19:50:28.621Z"}