{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9733309","patent":{"patent_number":"US-9733309","title":"Built-in self-test circuit","assignee":null,"inventors":[],"filing_date":"2015-12-08T00:00:00.000Z","publication_date":"2017-08-15T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C","G11C"],"num_claims":6,"abstract":"A built-in self-test (BIST) circuit is disclosed which integrates the functions of pins for test input data TDI, test output data TDO and an analog input signal VPP into a single digital/analog input/output module, and internally produces a test trigger signal STROBE and a digital-analog conversion signal ANA. In addition, when there is a need to power the test chip with a voltage or current, a data generation circuit of the BIST circuit can generate a digital-analog conversion signal to change an operating mode of the digital/analog input/output module and hence enable the transmission of analog data. According to the present invention, the testing can be performed with only two pins, which leads to an improvement in test efficiency and a reduction in test cost."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Built-in self-test circuit","description":"A built-in self-test (BIST) circuit is disclosed which integrates the functions of pins for test input data TDI, test output data TDO and an analog input signal VPP into a single digital/analog input/","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9733309","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9733309","citation_suggestion":"Patentable. \"Built-in self-test circuit\" (US-9733309). https://patentable.app/patents/US-9733309","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9733309","json":"https://patentable.app/api/llm-context/US-9733309","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T13:16:09.043Z"}