{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9733640","patent":{"patent_number":"US-9733640","title":"Method and apparatus for database-assisted requalification reticle inspection","assignee":null,"inventors":[],"filing_date":"2012-10-01T00:00:00.000Z","publication_date":"2017-08-15T00:00:00.000Z","cpc_codes":["G05B","G06F","G05B"],"num_claims":25,"abstract":"A method embodiment includes providing a reticle design data that specify a plurality of printable features that are formed on the wafer using the reticle and a plurality of nonprintable features that are not formed on the wafer using such reticle, wherein the reticle design data is usable to fabricate the reticle. A reduced design database is generated from the reticle design data and this reduced design database includes a description or map of the nonprintable features of the reticle, a description or map of a plurality of cell-to-cell regions of the reticle, and a grayscale reticle image that is rasterized from the reticle design data. The reduced design database, along with the reticle, is transferred to a fabrication facility so that the reduced design database is usable to periodically inspect the reticle in the fabrication facility."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and apparatus for database-assisted requalification reticle inspection","description":"A method embodiment includes providing a reticle design data that specify a plurality of printable features that are formed on the wafer using the reticle and a plurality of nonprintable features that","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9733640","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9733640","citation_suggestion":"Patentable. \"Method and apparatus for database-assisted requalification reticle inspection\" (US-9733640). https://patentable.app/patents/US-9733640","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9733640","json":"https://patentable.app/api/llm-context/US-9733640","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T17:45:43.266Z"}