{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9734271","patent":{"patent_number":"US-9734271","title":"Method of determining galvanic corrosion and interconnect structure in a semiconductor device for prevention of galvanic corrosion","assignee":null,"inventors":[],"filing_date":"2015-12-10T00:00:00.000Z","publication_date":"2017-08-15T00:00:00.000Z","cpc_codes":["G06F","G06F","H01L","G06F"],"num_claims":20,"abstract":"In some embodiments, in a method for a semiconductor device having an interconnect structure, a design layout is received. A metal line in the design layout is identified, which has at least one via thereon and does not couple downward with an oxide diffusion region. The area of a gate oxide coupled with the metal line is obtained from the design layout. The method comprises determining whether the area of the gate oxide is greater than a first predetermined value. When the area of the gate oxide is greater than the first predetermined value, a charge release path is coupled with the metal line."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method of determining galvanic corrosion and interconnect structure in a semiconductor device for prevention of galvanic corrosion","description":"In some embodiments, in a method for a semiconductor device having an interconnect structure, a design layout is received. A metal line in the design layout is identified, which has at least one via t","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9734271","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9734271","citation_suggestion":"Patentable. \"Method of determining galvanic corrosion and interconnect structure in a semiconductor device for prevention of galvanic corrosion\" (US-9734271). https://patentable.app/patents/US-9734271","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9734271","json":"https://patentable.app/api/llm-context/US-9734271","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T04:56:07.577Z"}