{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9736389","patent":{"patent_number":"US-9736389","title":"Device and method for characterizing a sample using localized measurements","assignee":null,"inventors":[],"filing_date":"2013-07-25T00:00:00.000Z","publication_date":"2017-08-15T00:00:00.000Z","cpc_codes":["H04N"],"num_claims":27,"abstract":"Device for characterizing a sample includes a measuring instrument for determining a physical characteristic of the sample at one point thereof; a positioning system for positioning the measuring instrument relative to the sample, to obtain a measurement at a point localized on the sample. The positioning system includes: a locating target connected to the sample and defining a reference system linked thereto; elements for acquiring and analyzing images, including lighting elements for illuminating the target; an optical imaging system connected to the measuring instrument for acquiring an image of at least one portion of the target; and image analysis elements for analyzing the image to determine the position and orientation of the optical imaging system relative to the target; calibration elements for determining the position of the measuring instrument relative to the optical imaging system; and processing elements for processing the results of the image analysis and of the calibration."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Device and method for characterizing a sample using localized measurements","description":"Device for characterizing a sample includes a measuring instrument for determining a physical characteristic of the sample at one point thereof; a positioning system for positioning the measuring inst","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9736389","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9736389","citation_suggestion":"Patentable. \"Device and method for characterizing a sample using localized measurements\" (US-9736389). https://patentable.app/patents/US-9736389","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9736389","json":"https://patentable.app/api/llm-context/US-9736389","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T07:19:01.636Z"}