{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9746878","patent":{"patent_number":"US-9746878","title":"Semiconductor device and method of testing semiconductor device","assignee":null,"inventors":[],"filing_date":"2015-11-30T00:00:00.000Z","publication_date":"2017-08-29T00:00:00.000Z","cpc_codes":["G06F","H01L","H01L","H01L","H01L"],"num_claims":7,"abstract":"A semiconductor device includes chips, wherein a first chip: an internal circuit; first selectors to output signals from one of first outputs; second selectors to output signals from one of second outputs; first output buffer units to relay/interrupt signals output from one of the first outputs; second output buffer units to relay/interrupt signals output from one of the second outputs; first terminals to output a signal from the respective first output buffer units and belong to a first group in which the first terminals are placed at positions distant by first distances; and second terminals to output a signal from the respective second output buffer units and belong to a second group in which the second terminals are placed at positions distant by second distances and each of the second terminals is placed at a position distant from an adjacent first terminal of the first terminals by third distances."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor device and method of testing semiconductor device","description":"A semiconductor device includes chips, wherein a first chip: an internal circuit; first selectors to output signals from one of first outputs; second selectors to output signals from one of second out","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9746878","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9746878","citation_suggestion":"Patentable. \"Semiconductor device and method of testing semiconductor device\" (US-9746878). https://patentable.app/patents/US-9746878","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9746878","json":"https://patentable.app/api/llm-context/US-9746878","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T09:33:42.736Z"}