{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9747518","patent":{"patent_number":"US-9747518","title":"Automatic calibration sample selection for die-to-database photomask inspection","assignee":null,"inventors":[],"filing_date":"2015-05-04T00:00:00.000Z","publication_date":"2017-08-29T00:00:00.000Z","cpc_codes":["G06T","G06F","G06T","G06T","G06V"],"num_claims":20,"abstract":"A method for selecting samples of reticle design data patterns in order to calibrate the parameters based on which the reference image used in a die-to-database reticle inspection method is rendered, the method comprising the steps of applying local binary pattern (LBP) analysis to a plurality of samples to obtain a p-dimensional vector output for each of the plurality of samples, clustering the q-D data points to M groups, selecting one sample from each clustered group, calculating evaluation scores for the samples selected, and, selecting a portion of the M samples on the representativeness score and the diversity score."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Automatic calibration sample selection for die-to-database photomask inspection","description":"A method for selecting samples of reticle design data patterns in order to calibrate the parameters based on which the reference image used in a die-to-database reticle inspection method is rendered, ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9747518","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9747518","citation_suggestion":"Patentable. \"Automatic calibration sample selection for die-to-database photomask inspection\" (US-9747518). https://patentable.app/patents/US-9747518","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9747518","json":"https://patentable.app/api/llm-context/US-9747518","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T05:21:02.136Z"}