{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9772366","patent":{"patent_number":"US-9772366","title":"Circuits and methods of testing a device under test using the same","assignee":null,"inventors":[],"filing_date":"2015-02-26T00:00:00.000Z","publication_date":"2017-09-26T00:00:00.000Z","cpc_codes":["H01L"],"num_claims":20,"abstract":"A method of testing a device under test (DUT) connected between first and second DUT nodes includes generating a set of control signals, and in response to the set of control signals, disconnecting a first voltage node from a first DUT node, connecting a second voltage node to the first DUT node, periodically connecting and disconnecting a third voltage node to and from the second DUT node at a predetermined frequency, disconnecting a fourth voltage node from the second DUT node when the third voltage node is connected to the second DUT node, and connecting the fourth voltage node to the second DUT node when the third voltage node is disconnected from the second DUT node. A circuit that performs the method is also disclosed."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Circuits and methods of testing a device under test using the same","description":"A method of testing a device under test (DUT) connected between first and second DUT nodes includes generating a set of control signals, and in response to the set of control signals, disconnecting a ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9772366","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9772366","citation_suggestion":"Patentable. \"Circuits and methods of testing a device under test using the same\" (US-9772366). https://patentable.app/patents/US-9772366","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9772366","json":"https://patentable.app/api/llm-context/US-9772366","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T11:23:20.755Z"}