{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9772377","patent":{"patent_number":"US-9772377","title":"Circuit division method for test pattern generation and circuit division device for test pattern generation","assignee":null,"inventors":[],"filing_date":"2015-11-11T00:00:00.000Z","publication_date":"2017-09-26T00:00:00.000Z","cpc_codes":["G06F","G06F","G06F","G06F","G06F","G06F"],"num_claims":15,"abstract":"A circuit division method for test pattern generation in which a computer performs processes of: acquiring, for each of a plurality of blocks included in a target circuit for test pattern generation, a first feature amount regarding a size of each block and a second feature amount regarding a function of the block; classifying the plurality of blocks into a plurality of groups so that blocks for which the acquired first feature amount is within a first predetermined range and the acquired second feature amount is within a second predetermined range belong to an identical group; and assigning, for each of the classified groups, each of the blocks included in the group to one of a plurality of divided circuits of a division number based on a ratio of the number of blocks included in the group to the division number by which the plurality of blocks are divided."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Circuit division method for test pattern generation and circuit division device for test pattern generation","description":"A circuit division method for test pattern generation in which a computer performs processes of: acquiring, for each of a plurality of blocks included in a target circuit for test pattern generation, ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9772377","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9772377","citation_suggestion":"Patentable. \"Circuit division method for test pattern generation and circuit division device for test pattern generation\" (US-9772377). https://patentable.app/patents/US-9772377","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9772377","json":"https://patentable.app/api/llm-context/US-9772377","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T08:29:15.956Z"}