{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9784560","patent":{"patent_number":"US-9784560","title":"Length metrology apparatus and methods for suppressing phase noise-induced distance measurement errors","assignee":null,"inventors":[],"filing_date":"2015-10-29T00:00:00.000Z","publication_date":"2017-10-10T00:00:00.000Z","cpc_codes":["H04B","H04B","H04B"],"num_claims":16,"abstract":"Length metrology apparatuses and methods are disclosed for measuring both specular and non-specular surfaces with high accuracy and precision, and with suppressed phase induced distance errors. In one embodiment, a system includes a laser source exhibiting a first and second laser outputs with optical frequencies that are modulated linearly over large frequency ranges. The system further includes calibration and signal processing portions configured to determine a calibrated distance to at least one sample."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Length metrology apparatus and methods for suppressing phase noise-induced distance measurement errors","description":"Length metrology apparatuses and methods are disclosed for measuring both specular and non-specular surfaces with high accuracy and precision, and with suppressed phase induced distance errors. In one","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9784560","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9784560","citation_suggestion":"Patentable. \"Length metrology apparatus and methods for suppressing phase noise-induced distance measurement errors\" (US-9784560). https://patentable.app/patents/US-9784560","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9784560","json":"https://patentable.app/api/llm-context/US-9784560","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T09:18:34.613Z"}