{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9791267","patent":{"patent_number":"US-9791267","title":"Determining three-dimensional information from projections or placement of two-dimensional patterns","assignee":null,"inventors":[],"filing_date":"2015-05-12T00:00:00.000Z","publication_date":"2017-10-17T00:00:00.000Z","cpc_codes":["A61B","A61B","A61B","G06T","G06T","H04N","H04N","A61B","A61B"],"num_claims":15,"abstract":"Embodiments of a shape measurement system and related methods are disclosed. In some embodiments, the system places a two-dimensional initial pattern, which can be implemented as a standalone molding or can be attached to a light source or printed on an outfit, onto a surface of a three-dimensional object. The system captures a transformed version of the initial pattern in two dimensions that is distorted due to the varying depth of the surface. The system then analyzes the transformed pattern and derives three-dimensional information regarding the target object. The analysis, which can incorporate a calibration process, can rely on the projection nature of the light source, the isomorphism/non-isomorphism of the initial pattern, and other factors."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Determining three-dimensional information from projections or placement of two-dimensional patterns","description":"Embodiments of a shape measurement system and related methods are disclosed. In some embodiments, the system places a two-dimensional initial pattern, which can be implemented as a standalone molding ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9791267","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9791267","citation_suggestion":"Patentable. \"Determining three-dimensional information from projections or placement of two-dimensional patterns\" (US-9791267). https://patentable.app/patents/US-9791267","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9791267","json":"https://patentable.app/api/llm-context/US-9791267","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T09:23:49.381Z"}