{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9791499","patent":{"patent_number":"US-9791499","title":"Circuit to detect previous use of computer chips using passive test wires","assignee":null,"inventors":[],"filing_date":"2015-01-22T00:00:00.000Z","publication_date":"2017-10-17T00:00:00.000Z","cpc_codes":["G06F","H01L"],"num_claims":11,"abstract":"A test structure and method to detect open circuits due to electromigration or burn-out in test wires and inter-level vias. Electromigration occurs when current flows through circuit wires leading to a circuit interruption within the wire. The test structure is a passive test wire arranged in one of several configurations within the circuit of a computer chip. The dimensions and resistances of test wires can vary according to the test structure configuration. Each test wire is measured for an electrical discontinuity after the computer chip is powered-on. If a wiring interruption is detected, it is concluded that the chip had been powered-on before."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Circuit to detect previous use of computer chips using passive test wires","description":"A test structure and method to detect open circuits due to electromigration or burn-out in test wires and inter-level vias. Electromigration occurs when current flows through circuit wires leading to ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9791499","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9791499","citation_suggestion":"Patentable. \"Circuit to detect previous use of computer chips using passive test wires\" (US-9791499). https://patentable.app/patents/US-9791499","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9791499","json":"https://patentable.app/api/llm-context/US-9791499","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T18:30:50.878Z"}