{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9799573","patent":{"patent_number":"US-9799573","title":"Method and apparatus for bond-pad charging protection of reference transistor test structures","assignee":null,"inventors":[],"filing_date":"2016-03-14T00:00:00.000Z","publication_date":"2017-10-24T00:00:00.000Z","cpc_codes":["H01L","H01L","H01L","H01L"],"num_claims":20,"abstract":"A method for preparing a reference transistor test structure having a transistor with multiple terminals is provided. The method may include placing a set of bond pads at a first layer of the reference transistor test structure with each of the bond pads connecting to its corresponding terminal of the transistor, wherein the first layer of the reference transistor test structure is an uppermost metal layer. The method may further include placing a first protection device at a second layer of the reference transistor test structure and connecting the first protection device to at least one of the terminals of the transistor, wherein the second layer is a lowermost metal layer."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and apparatus for bond-pad charging protection of reference transistor test structures","description":"A method for preparing a reference transistor test structure having a transistor with multiple terminals is provided. The method may include placing a set of bond pads at a first layer of the referenc","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9799573","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9799573","citation_suggestion":"Patentable. \"Method and apparatus for bond-pad charging protection of reference transistor test structures\" (US-9799573). https://patentable.app/patents/US-9799573","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9799573","json":"https://patentable.app/api/llm-context/US-9799573","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T15:31:08.199Z"}