{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9810641","patent":{"patent_number":"US-9810641","title":"Systems and methods for measuring physical characteristics of semiconductor device elements using structured light","assignee":null,"inventors":[],"filing_date":"2014-08-27T00:00:00.000Z","publication_date":"2017-11-07T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G06T","H01L","H01L","H01L","G01N","G01N","G06T","G06T","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L"],"num_claims":13,"abstract":"A method of determining a physical characteristic of an adhesive material on a semiconductor device element using structured light is provided. The method includes the steps of: (1) applying a structured light pattern to an adhesive material on a semiconductor device element; (2) creating an image of the structured light pattern using a camera; and (3) analyzing the image of the structured light pattern to determine a physical characteristic of the adhesive material. Additional methods and systems for determining physical characteristics of semiconductor devices and elements using structured light are also provided."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Systems and methods for measuring physical characteristics of semiconductor device elements using structured light","description":"A method of determining a physical characteristic of an adhesive material on a semiconductor device element using structured light is provided. The method includes the steps of: (1) applying a structu","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9810641","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9810641","citation_suggestion":"Patentable. \"Systems and methods for measuring physical characteristics of semiconductor device elements using structured light\" (US-9810641). https://patentable.app/patents/US-9810641","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9810641","json":"https://patentable.app/api/llm-context/US-9810641","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T06:04:21.846Z"}