{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9824945","patent":{"patent_number":"US-9824945","title":"Semiconductor device and semiconductor device measuring method","assignee":null,"inventors":[],"filing_date":"2016-03-03T00:00:00.000Z","publication_date":"2017-11-21T00:00:00.000Z","cpc_codes":["H01L"],"num_claims":14,"abstract":"A semiconductor device reduces measurement time. The semiconductor device according to an embodiment of the invention includes: plural series-coupled resistance elements for testing; plural switches coupled to a coupling path coupling the resistance elements; and plural selection circuits to select, by turning on or off the switches, a number of the series-coupled resistance elements to be measured as a group. In the semiconductor device: the switches include plural first switches coupled to plural groups of the resistance elements, each of the groups including N (N=2 or a larger integer) of the resistance elements; and the selection circuits turn the first switches on or off and thereby select a number of the series-coupled resistance elements to be measured as a group, the number equaling the N."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor device and semiconductor device measuring method","description":"A semiconductor device reduces measurement time. The semiconductor device according to an embodiment of the invention includes: plural series-coupled resistance elements for testing; plural switches c","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9824945","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9824945","citation_suggestion":"Patentable. \"Semiconductor device and semiconductor device measuring method\" (US-9824945). https://patentable.app/patents/US-9824945","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9824945","json":"https://patentable.app/api/llm-context/US-9824945","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T06:37:32.396Z"}