{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9835689","patent":{"patent_number":"US-9835689","title":"Semiconductor device and control for testing a transistor and diode","assignee":null,"inventors":[],"filing_date":"2015-03-10T00:00:00.000Z","publication_date":"2017-12-05T00:00:00.000Z","cpc_codes":["H02M","H02M","H02M","H02M","H02M"],"num_claims":7,"abstract":"A semiconductor device includes a transistor, a diode, a first detection circuit, a second detection circuit, a calculation circuit, and a determination circuit. The diode is connected in reverse parallel with the transistor. The first detection circuit is configured to detect a change rate of a gate voltage of the transistor with respect to time. The second detection circuit is configured to detect a gate current of the transistor. The calculation circuit is configured to calculate a gate capacitance based on the change rate of the gate voltage with respect to time, and the gate current. The determination circuit is configured to determine, based on a determination result of the gate capacitance when a charge is injected to a gate of the transistor, whether a current flows to the diode or to the transistor."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor device and control for testing a transistor and diode","description":"A semiconductor device includes a transistor, a diode, a first detection circuit, a second detection circuit, a calculation circuit, and a determination circuit. The diode is connected in reverse para","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9835689","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9835689","citation_suggestion":"Patentable. \"Semiconductor device and control for testing a transistor and diode\" (US-9835689). https://patentable.app/patents/US-9835689","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9835689","json":"https://patentable.app/api/llm-context/US-9835689","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T06:39:17.714Z"}