{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9838986","patent":{"patent_number":"US-9838986","title":"Calibration of high frequency signal measurement systems","assignee":null,"inventors":[],"filing_date":"2013-10-24T00:00:00.000Z","publication_date":"2017-12-05T00:00:00.000Z","cpc_codes":["H04W","H04B","H04B","H04L"],"num_claims":10,"abstract":"A method of calibrating a high frequency signal measurement system is described. The measurement system is in the form of a network analyzer (6) and has first and second phase-locked signal sources (SS1 & SS2) and at least two measurement receivers (18a, 18b). A phase meter (26) is provided. A reference signal (F0) is outputted at a first frequency from the first signal source (SS1). The second signal source (SS2) steps through a multiplicity of different test frequencies (nF0), being phase-locked with the reference signal (F0), which are applied in turn to a part of the measurement system. Measurements are taken, via the two measurement receivers (18a, 18b), of characteristics of the resulting signal at a measurement plane. The absolute phase of the signal at the measurement plane is also measured with the phase meter (26). Calibration data is generated which relates the characteristics of the signals as measured by the measurement system (6) and the absolute phase as measured with the phase meter (26)."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Calibration of high frequency signal measurement systems","description":"A method of calibrating a high frequency signal measurement system is described. The measurement system is in the form of a network analyzer (6) and has first and second phase-locked signal sources (S","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9838986","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9838986","citation_suggestion":"Patentable. \"Calibration of high frequency signal measurement systems\" (US-9838986). https://patentable.app/patents/US-9838986","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9838986","json":"https://patentable.app/api/llm-context/US-9838986","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T06:40:52.979Z"}