{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9846934","patent":{"patent_number":"US-9846934","title":"Pattern weakness and strength detection and tracking during a semiconductor device fabrication process","assignee":null,"inventors":[],"filing_date":"2016-03-10T00:00:00.000Z","publication_date":"2017-12-19T00:00:00.000Z","cpc_codes":["G06T","G06F","G06T","G06T"],"num_claims":17,"abstract":"Tracking patterns during a semiconductor fabrication process includes: obtaining an image of a portion of a fabricated device; extracting contours of the portion of the fabricated device from the obtained image; aligning the extracted contour to a matching section of a reference design; decomposing the matching section of the reference design into one or more patterns; and updating a pattern tracking database with information pertaining to at least one pattern in the one or more patterns generated as a result of the decomposition."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Pattern weakness and strength detection and tracking during a semiconductor device fabrication process","description":"Tracking patterns during a semiconductor fabrication process includes: obtaining an image of a portion of a fabricated device; extracting contours of the portion of the fabricated device from the obta","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9846934","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9846934","citation_suggestion":"Patentable. \"Pattern weakness and strength detection and tracking during a semiconductor device fabrication process\" (US-9846934). https://patentable.app/patents/US-9846934","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9846934","json":"https://patentable.app/api/llm-context/US-9846934","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T04:15:29.211Z"}