{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9854163","patent":{"patent_number":"US-9854163","title":"System and method for scanning a specimen into a focus-stacked scan","assignee":null,"inventors":[],"filing_date":"2015-03-22T00:00:00.000Z","publication_date":"2017-12-26T00:00:00.000Z","cpc_codes":["G06T","H04N","H04N","H04N","G06T","G06T","G06T"],"num_claims":17,"abstract":"This disclosure also teaches a system and method for scanning a specimen into a focus-stacked scan. In one embodiment, a method for scanning the specimen into a focus-stacked scan can comprise illuminating the specimen with a light. The specimen can comprise a topography. The depths of the topography can be variable along a z-axis. The method can also comprise dividing the specimen into a plurality of regions. Each of the regions can comprise a regional peak in the topography. Additionally, the method can comprise sampling each of the regions at a plurality of focal planes orthogonal to the z-axis by capturing, at each focal plane, an image of the region. The image can be focused on the focal plane. Lastly, the method can comprise focus-stacking, for each of the region the images within the region, into a focus-stacked image, and stitching together the focus-stacked images."},"analysis":{"summary":"The System and Method for Scanning a Specimen into a Focus-stacked Scan patent presents an innovative solution for capturing high-resolution images of specimens with complex topographies. The core innovation involves dividing the specimen into multiple regions, each with a regional peak, and sampling each region at a plurality of focal planes. These images are then focus-stacked and stitched together to create a comprehensive image with extended depth of field. This approach addresses the limitations of traditional microscopy techniques, which struggle to maintain focus across the entire sample when dealing with uneven surfaces.\n\nThe problem being solved is the difficulty in obtaining clear, focused images of specimens with variable depths along the z-axis. Existing microscopy methods often require manual adjustments and still result in blurry images. This patent offers an automated and efficient method that significantly improves image quality and reduces the need for manual intervention. \n\nThe key technical approach involves illuminating the specimen, dividing it into regions, sampling each region at multiple focal planes, and then using focus-stacking techniques to create a composite image. This process ensures that every part of the specimen is in sharp focus, regardless of its depth. The business value lies in its potential to improve diagnostics in biomedical research, enhance materials science by providing detailed surface topography analysis, and drive innovation in digital imaging. \n\nThe market opportunity is substantial, as high-resolution imaging is crucial in various fields. The System and Method for Scanning a Specimen into a Focus-stacked Scan offers a competitive advantage by providing higher resolution images, reducing the need for manual adjustments, and handling specimens with complex topographies. This technology is poised to play a crucial role in shaping the future of microscopy and digital imaging.","layman_explanation":"The System and Method for Scanning a Specimen into a Focus-stacked Scan patent addresses a common problem in microscopy: obtaining clear, focused images of specimens with uneven surfaces. Traditional microscopes have a limited depth of field, meaning they can only focus on one plane at a time. When examining a specimen with a complex topography, parts of the image will inevitably be out of focus, making it difficult to analyze the entire sample.\n\nThe business problem this solves is the inefficiency and inaccuracy of current imaging methods. Researchers and professionals often spend significant time manually adjusting the focus of a microscope to capture different parts of a specimen. This process is not only time-consuming but also prone to error, as it relies on the subjective judgment of the operator. The System and Method for Scanning a Specimen into a Focus-stacked Scan automates this process, providing a more efficient and accurate way to obtain high-resolution images.\n\nThis technology works by dividing the specimen into multiple regions and then capturing images of each region at different focal planes. The system then uses a process called focus-stacking to combine the sharpest parts of each image into a single, fully focused image. Think of it like taking multiple photos of a landscape, each focused on a different part, and then combining them to create a panorama where everything is in focus. \n\nThis matters because it opens up new possibilities for research and development in various fields. In biomedical research, it allows scientists to study cellular and tissue structures in greater detail, leading to improved diagnostics and a better understanding of disease mechanisms. In materials science, it enables the precise examination of surface topographies, aiding in the development of advanced materials with tailored properties. The potential ROI is significant, as this technology can improve the efficiency of research and development processes, leading to faster innovation and increased productivity.\n\nFuture applications of this technology include integration with artificial intelligence and machine learning algorithms for automated image analysis. As the technology becomes more accessible and affordable, it is likely to be adopted by a wider range of industries, driving further innovation and creating new market opportunities. The investment implications are clear: this technology has the potential to transform microscopy and digital imaging, creating significant value for investors and stakeholders.","technical_analysis":"The System and Method for Scanning a Specimen into a Focus-stacked Scan patent details a sophisticated approach to microscopy, addressing the challenges of imaging specimens with complex three-dimensional structures. The technical architecture involves several key components: a light source for illuminating the specimen, a precision stage for positioning the specimen and controlling movement along the z-axis, a high-resolution camera for capturing images, and an image processing unit for performing focus-stacking and stitching operations.\n\nThe implementation details include algorithms for dividing the specimen into regions, sampling each region at multiple focal planes, and combining the images using focus-stacking techniques. The algorithm for dividing the specimen typically involves identifying regional peaks in the topography and using these peaks to define the boundaries of each region. The sampling process involves capturing images at a series of focal planes orthogonal to the z-axis, with the spacing between the planes optimized to ensure that all parts of the specimen are in focus in at least one of the images.\n\nThe focus-stacking algorithm selects the sharpest portions from each image and combines them to create a composite image with extended depth of field. This algorithm often involves techniques such as wavelet decomposition, Laplacian filtering, and gradient-based sharpness metrics. The stitching module then combines the focus-stacked images from each region to create a complete image of the entire specimen.\n\nIntegration patterns involve connecting the system to external data sources and analysis tools. The captured images can be stored in standard formats such as TIFF or JPEG and can be analyzed using software packages such as ImageJ or MATLAB. Performance characteristics depend on factors such as the speed of the camera, the processing power of the image processing unit, and the complexity of the focus-stacking algorithm. Code-level implications involve optimizing the algorithms for speed and memory usage, as well as developing user-friendly interfaces for controlling the system and analyzing the results.\n\nThis technology has significant implications for various fields. In biomedical research, it enables detailed imaging of cellular and tissue structures, which can lead to improved diagnostics and a better understanding of disease mechanisms. In materials science, it allows for the precise examination of surface topographies, aiding in the development of advanced materials with tailored properties.","business_analysis":"The System and Method for Scanning a Specimen into a Focus-stacked Scan patent presents a significant market opportunity within the microscopy and digital imaging industries. The core value proposition lies in its ability to capture high-resolution images of specimens with complex topographies, overcoming the limitations of traditional microscopy techniques. This technology addresses a critical need in various fields, including biomedical research, materials science, and industrial inspection.\n\nThe market opportunity size is substantial, as high-resolution imaging is essential in numerous applications. The global microscopy market is projected to reach billions of dollars in the coming years, driven by increasing demand for advanced imaging technologies. This patent offers a competitive advantage by providing higher resolution images, reducing the need for manual adjustments, and handling specimens with complex topographies. The revenue potential is significant, as the technology can be licensed to microscope manufacturers, research institutions, and industrial companies.\n\nPotential business models include licensing the patent to microscope manufacturers, offering the technology as a service to research institutions, and developing a standalone product for specific applications. Strategic positioning involves targeting markets where high-resolution imaging is critical, such as biomedical research and materials science. The competitive advantages include the ability to capture clear images of specimens with complex topographies, the automated focus adjustment process, and the reduced need for manual intervention. \n\nROI projections depend on factors such as the licensing fees, service revenues, and product sales. However, the potential for significant returns is high, given the value proposition and the market opportunity. The System and Method for Scanning a Specimen into a Focus-stacked Scan has the potential to generate substantial revenue and create significant value for its stakeholders. This innovation is poised to play a crucial role in shaping the future of microscopy and digital imaging, providing a competitive edge in a rapidly evolving market.","faqs":null,"topics":["focus stacking","microscopy","specimen scanning","high-resolution imaging","digital imaging"],"tech_cluster":null},"seo":{"title":"Focus-Stacked Specimen Scanning - Patent US-9854163","description":"Explore the System and Method for Scanning a Specimen into a Focus-stacked Scan, enabling high-resolution imaging of complex specimens. Full patent analysis and claims.","keywords":["focus stacking","microscopy","specimen scanning","high-resolution imaging","digital imaging","patent","patent US-9854163"]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9854163","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9854163","citation_suggestion":"Patentable. \"System and method for scanning a specimen into a focus-stacked scan\" (US-9854163). https://patentable.app/patents/US-9854163","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9854163","json":"https://patentable.app/api/llm-context/US-9854163","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T18:50:39.580Z"}