Method for Measuring the Position of a Mobile Structure

1. A method for measuring the position of a mobile structure in a set of reference axes, the structure comprising a plurality of recurrent elements intrinsic to the structure, the method comprising the following successive steps: a. acquiring, by a processor, images of the structure taken simultaneously by a plurality of optical devices, each recurrent element of the structure being in a field of view of at least three separate optical devices, wherein the at least three separate optical devices are fixed in the reference axes; b. extracting from each of the images, by the processor, the recurrent elements and determining, by the processor, the position of said recurrent elements in the image; c. computing, by the processor, at least one indicator for each one of the recurrent elements detected in each image; d. identifying, by the processor, each of the recurrent elements by associating a unique identifier with each of said elements, the identifier being related to a position of each of the optical devices in the set of reference axes, and to at least one indicator associated with each of said elements in each image; and e. determining the position, by the processor implementing a photogrammetric algorithm, of each recurrent element in the set of reference axes; wherein step b) comprises searching, for each of the recurrent elements, for a smallest ellipse containing the recurrent element; wherein step d) further includes using a learning algorithm of the wide margin separators class in such a way as to match, for a first image of the images and a second image of the images taken by two of the at least three separate optical devices, ellipses which have the same indicators in the first image and in the second image.

2. The method as claimed in claim 1 , wherein step b) comprises: an adaptive thresholding of each of the images in such a way as to detect a characteristic shape of the recurrent elements; and detecting a contour for each characteristic shape detected.

3. The method as claimed in claim 2 , wherein step b) comprises searching, for each contour, for a smallest ellipse containing the contour.

4. The method as claimed in claim 1 , wherein each indicator is calculated as a function of the configuration of the recurrent elements on the structure and is taken from among the following indicators: a number of ellipses in the vicinity of an ellipse being studied; if the ellipse is included on a horizontal ellipse line; if the ellipse is included on a vertical ellipse line; if the ellipse is included on a diagonal ellipse line; if the ellipse is included at the intersection of two ellipse lines; if the ellipse is at the center of an intersection of vertical and horizontal ellipse lines; if the ellipse is at the end of an ellipse line; the determination of the angle of attack with the centers of the closest ellipses; the position of the ellipse in the image.

5. The method as claimed in claim 1 , comprising an additional step of displaying, on a screen, the position of each recurrent element of the structure in the set of reference axes.

6. The method as claimed in claim 1 , wherein the recurrent elements intrinsic to the structure are taken from rivets.

7. The method as claimed in claim 1 , wherein the recurrent elements intrinsic to the structure are taken from bolts.

8. The method as claimed in claim 1 , wherein the recurrent elements intrinsic to the structure are taken from weld spots.

9. A method for measuring the position of a mobile structure in a set of reference axes, the structure comprising a plurality of recurrent elements intrinsic to the structure, the method comprising the following successive steps: a. acquiring, by a processor, images of the structure taken simultaneously by a plurality of optical devices, each recurrent element of the structure being in a field of view of at least three separate optical devices; b. extracting from each of the images, by the processor, the recurrent elements and determining, by the processor, the position of said recurrent elements in the image; c. computing, by the processor, at least one indicator for each one of the recurrent elements detected in each image; d. identifying, by the processor, each of the recurrent elements by associating a unique identifier with each of said elements, the identifier being related to a position of each of the optical devices in the set of reference axes, and to at least one indicator associated with each of said elements in each image; and e. determining the position, by the processor implementing a photogrammetric algorithm, of each recurrent element in the set of reference axes; wherein step b) comprises searching, for each of the recurrent elements, for a smallest ellipse containing the recurrent element; wherein step d) further includes using a learning algorithm of the wide margin separators class in such a way as to match, for a first image of the images and a second image of the images taken by two of the at least three separate optical devices, ellipses which have the same indicators in the first image and in the second image.

10. The method as claimed in claim 9 , wherein step b) comprises: an adaptive thresholding of each of the images in such a way as to detect a characteristic shape of the recurrent elements; and detecting a contour for each characteristic shape detected.

11. The method as claimed in claim 10 , wherein step b) comprises searching, for each contour, for a smallest ellipse containing the contour.

12. The method as claimed in claim 9 , wherein each indicator is calculated as a function of the configuration of the recurrent elements on the structure and is taken from among the following indicators: a number of ellipses in the vicinity of an ellipse being studied; if the ellipse is included on a horizontal ellipse line; if the ellipse is included on a vertical ellipse line; if the ellipse is included on a diagonal ellipse line; if the ellipse is included at the intersection of two ellipse lines; if the ellipse is at the center of an intersection of vertical and horizontal ellipse lines; if the ellipse is at the end of an ellipse line; the determination of the angle of attack with the centers of the closest ellipses; the position of the ellipse in the image.

13. The method as claimed in claim 9 , comprising an additional step of displaying, on a screen, the position of each recurrent element of the structure in the set of reference axes.

14. The method as claimed in claim 9 , wherein the recurrent elements intrinsic to the structure are taken from rivets.

15. The method as claimed in claim 9 , wherein the recurrent elements intrinsic to the structure are taken from bolts.

16. The method as claimed in claim 9 , wherein the recurrent elements intrinsic to the structure are taken from weld spots.