System and Method for Enhanced Characterization for System Identification of Non-Linear Systems

1. A computer-implemented method for use in a non-linear system associated with an electronic circuit design comprising: simulating an electronic circuit design; identifying the non-linear system associated with the electronic circuit design; determining a degree of severity of non-linearity of the non-linear system associated with the electronic circuit design; if the degree of severity is less than a predefined threshold, receiving a random input pattern and deriving a single impulse response characterization, wherein the random input pattern is based upon, at least in part, an electronic circuit simulation associated with the electronic circuit design; and if the degree of severity is higher than a predefined threshold, receiving a random input stream having a plurality of patterns and deriving multiple pattern-dependent impulse response characterizations.

2. The computer-implemented method of claim 1 , wherein the multiple pattern-dependent impulse response characterizations are automatically generated for all prior combinations of bits.

3. The computer-implemented method of claim 2 , further comprising: providing the multiple pattern-dependent impulse response characterizations to one or more algorithmic modeling interface (“AMI”) models associated with an electronic design application.

4. The computer-implemented method of claim 3 , wherein the one or more AMI models are used with an Input/output Buffer Information Specification (“IBIS”) specification compliant simulator.

5. The computer-implemented method of claim 1 , further comprising: generating a channel simulation waveform.

6. The computer-implemented method of claim 1 , wherein the random input pattern is a pseudorandom binary sequence (“PRBS”).

7. A non-transitory computer-readable storage medium having stored thereon instructions that when executed by a machine result in the following operations: simulating an electronic circuit design; identifying a non-linear system associated with an electronic circuit design; determining a degree of severity of non-linearity of the non-linear system associated with the electronic circuit design; and if the degree of severity is less than a predefined threshold, receiving a random input pattern and deriving a single impulse response characterization, wherein the random input pattern is based upon, at least in part, an electronic circuit simulation associated with the electronic circuit design; and if the degree of severity is higher than a predefined threshold, receiving a random input stream having a plurality of patterns and deriving multiple pattern-dependent impulse response characterizations.

8. The computer-readable storage medium of claim 7 , wherein the multiple pattern-dependent impulse response characterizations are automatically generated for all prior combinations of bits.

9. The computer-readable storage medium of claim 8 , further comprising: providing the multiple pattern-dependent impulse response characterizations to one or more algorithmic modeling interface (“AMI”) models associated with an electronic design application.

10. The computer-readable storage medium of claim 9 , wherein the one or more AMI models are used with an Input/output Buffer Information Specification (“IBIS”) specification compliant simulator.

11. The computer-readable storage medium of claim 7 , further comprising: generating a channel simulation waveform.

12. The computer-readable storage medium of claim 7 , wherein the random input pattern is a pseudorandom binary sequence (“PRBS”).

13. A system for use in a non-linear system associated with an electronic circuit design comprising: a computing device configured to simulate an electronic circuit design and identify the non-linear system associated with the electronic circuit design and to determine a degree of severity of non-linearity of the non-linear system associated with the electronic circuit design, wherein if the degree of severity is less than a predefined threshold, the computing device is further configured to receive a random input pattern and derive a single impulse response characterization, wherein the random input pattern is based upon, at least in part, an electronic circuit simulation associated with the electronic circuit design and if the degree of severity is higher than a predefined threshold, the computing device is further configured to receive a random input stream having a plurality of patterns and deriving multiple pattern-dependent impulse response characterizations.

14. The system of claim 13 , wherein the multiple pattern-dependent impulse response characterizations are automatically generated for all prior combinations of bits.

15. The system of claim 14 , wherein the one or more processors are further configured to: provide the multiple pattern-dependent impulse response characterizations to one or more algorithmic modeling interface (“AMI”) models associated with an electronic design application.

16. The system of claim 15 , wherein the one or more AMI models are used with an Input/output Buffer Information Specification (“IBIS”) specification compliant simulator.

17. The system of claim 13 , wherein the one or more processors are further configured to: generate a channel simulation waveform.