Legal claims defining the scope of protection, as filed with the USPTO.
1. An optical sensor, comprising: a substrate; a transistor, disposed over the substrate; a first electrode, disposed over the substrate and electrically connected to the transistor; a second electrode, disposed over the first electrode; a photodiode, disposed between the first electrode and the second electrode; and an anti-reflective layer, disposed over the second electrode, comprising a first U-shaped portion lining the second electrode.
2. The optical sensor of claim 1 , wherein the first U-shaped portion of the anti-reflective layer is conformal to a second U-shaped portion of the second electrode.
3. The optical sensor of claim 2 , wherein the photodiode comprises a third U-shaped portion disposed between the second U-shaped portion of the second electrode and a fourth U-shaped portion of the first electrode.
4. The optical sensor of claim 1 , wherein the anti-reflective layer further comprises: a planar portion, extending along an extending direction of the substrate; and a convex portion, connecting the planar portion and the first U-shaped portion, wherein a thickness of the convex portion is greater than a thickness of the planar portion.
5. The optical sensor of claim 4 , wherein the convex portion has a configuration of a ring shape from a top view perspective.
6. The optical sensor of claim 5 , wherein an outer diameter of the convex portion is greater than 3 microns.
7. The optical sensor of claim 5 , wherein an inner diameter of the convex portion is greater than 1 micron and less than 3 microns.
8. The optical sensor of claim 4 , wherein the thickness of the convex portion is in a range of 250 to 450 nanometers.
9. The optical sensor of claim 4 , wherein the thickness of the planar portion is in a range of 200 to 350 nanometers.
10. The optical sensor of claim 4 , wherein the thickness of the convex portion is in a range of 300 to 350 nanometers, and a thickness of the second electrode is in a range of 20 to 80 nanometers.
11. The optical sensor of claim 1 , wherein the anti-reflective layer further comprises: a second convex portion, disposed at a bottom of the first U-shaped portion and protruding away from the photodiode.
12. The optical sensor of claim 1 , further comprising: a dielectric layer, disposed between the transistor and the first electrode, comprising a through hole.
13. The optical sensor of claim 12 , wherein the first electrode lines the through hole thereby penetrating the dielectric layer to electrically connect to the transistor.
14. The optical sensor of claim 12 , further comprising: a reflective layer, disposed between the dielectric layer and the first electrode, and lining the through hole.
15. The optical sensor of claim 14 , wherein a thickness of the reflective layer is in a range of 130 to 180 nanometers, and a thickness of the first electrode is in a range of 10 to 50 nanometers.
16. The optical sensor of claim 1 , further comprising: a connecting line, disposed between the transistor and the first electrode, wherein a bottom of a U-shaped portion of the first electrode is disposed within a top surface of the connecting line.
17. The optical sensor of claim 1 , further comprising: a capacitor, disposed over the substrate, and electrically connected to the transistor.
18. The optical sensor of claim 17 , wherein the capacitor, the photodiode and the transistor are electrically connected through one connecting line.
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September 15, 2020
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