Legal claims defining the scope of protection. Each claim is shown in both the original legal language and a plain English translation.
1. A method for evaluating a design of a configurable inspection station for inspecting a workpiece, the design of the configurable inspection station having a plurality of parameters, and the method comprising: providing a respective lighting model for each of a first set of one or more illumination sources of the configurable inspection station; providing a respective light mapping for each of the one or more lighting models of the configurable inspection station; providing a first workpiece model and a first material mapping for a first workpiece; generating a corresponding simulated image based on the one or more respective lighting models, the one or more respective light mappings, the first workpiece model, and the first material mapping; defining, by a processor, a feature corresponding to an attribute of the workpiece such that the feature is searched for in the simulated image by a computer vision application in communication with an image rendering application; repeatedly performing, for a predetermined number of times: receiving, by the processor, an input defining a respective region of interest in the simulated image for the computer vision application to search for the feature corresponding to the attribute; and determining, by the processor utilizing the computer vision application, whether the feature corresponding to the attribute of the workpiece is identifiable, in the region of interest in the simulated image; and calculating, by the processor, a first evaluation score for the design of the configurable inspection station based on the number of times the computer vision application determined the feature corresponding to the attribute of the workpiece was identifiable in the regions of interest in the simulated image.
The invention relates to a method for evaluating the design of a configurable inspection station used to inspect workpieces. The inspection station includes multiple adjustable parameters, such as illumination sources, and the method assesses how well the design performs in detecting workpiece attributes. The method begins by defining lighting models for each illumination source in the inspection station and generating light mappings for these models. A workpiece model and material mapping are also provided to simulate the workpiece's appearance under the inspection station's lighting conditions. A simulated image of the workpiece is then generated using these inputs. A feature corresponding to a workpiece attribute is defined, and a computer vision application searches for this feature in the simulated image. The method repeatedly tests different regions of interest in the simulated image to determine if the feature is identifiable. The evaluation score for the inspection station design is calculated based on how often the computer vision application successfully identifies the feature in the specified regions. This approach helps optimize the inspection station's configuration for reliable defect detection.
2. The method of claim 1 , wherein the plurality of parameters comprise workpiece and illumination parameters and the respective lighting model for each of the first set of one or more illumination sources, the respective light mapping for each of the one or more lighting models, the first workpiece model and the first material mapping define a first set of instances for the workpiece and illumination parameters; further comprising: changing one of the first set of instances so as to generate a second set of instances for the workpiece and illumination parameters; generating a corresponding changed simulated image based on the second set of instances for the workpiece and illumination parameters; repeatedly performing, for a predetermined number of times: receiving, by the processor, an input defining a respective region of interest in the changed simulated image for the computer vision application to search for the feature corresponding to the attribute; and determining, by the processor utilizing the computer vision application, whether the feature corresponding to the attribute of the workpiece is identifiable, in the region of interest in the changed simulated image; calculating, by the processor, a second evaluation score for the design of the configurable inspection station based on the number of times the computer vision application determined the feature corresponding to the attribute of the workpiece was identifiable in the regions of interest in the changed simulated image; and selecting the design of the configurable inspection station based on a comparison of the first evaluation score and the second evaluation score.
The invention relates to optimizing the design of a configurable inspection station for computer vision-based workpiece inspection. The system addresses the challenge of ensuring reliable feature detection in varying illumination and workpiece conditions. The method involves defining a set of parameters including workpiece characteristics, illumination settings, and lighting models for multiple illumination sources. These parameters, along with a workpiece model and material mapping, generate a first set of simulated images. The system then modifies one or more of these parameters to create a second set of simulated images. For each modified image, a region of interest is selected, and a computer vision application checks whether the target feature is identifiable. This process is repeated multiple times, and an evaluation score is calculated based on the frequency of successful feature detection. The inspection station design is selected by comparing the evaluation scores from the original and modified parameter sets. This approach ensures optimal configuration for consistent and accurate inspection performance under varying conditions.
3. The method of claim 2 , wherein changing one of the first set of instances comprises changing a first light mapping for one illumination source to a second light mapping having a different light intensity.
This invention relates to dynamic light mapping for illumination systems, particularly in environments where lighting conditions need to be adjusted in real-time. The problem addressed is the inability of traditional lighting systems to efficiently adapt to changing visual requirements, such as varying brightness levels or lighting patterns, without manual intervention or complex hardware modifications. The method involves a system with multiple illumination sources, each capable of projecting light onto a target surface. The system includes a first set of instances representing initial light mappings, where each instance defines how an illumination source projects light onto the surface. The method dynamically changes one of these instances by altering the light mapping for a specific illumination source. Specifically, the change involves transitioning from a first light mapping to a second light mapping, where the second mapping has a different light intensity. This adjustment allows the system to modify brightness or illumination patterns without requiring physical changes to the hardware. The method ensures that the changes are applied in a controlled manner, maintaining desired visual effects while optimizing energy efficiency and performance. The system may also include additional instances for other illumination sources, allowing for coordinated adjustments across multiple light sources to achieve complex lighting effects. The dynamic nature of the method enables real-time adaptation to environmental changes or user preferences, improving flexibility and usability in lighting applications.
4. The method of claim 2 , wherein changing one of the first set of instances comprises changing a first workpiece model to a second workpiece model having a different shape.
This invention relates to a method for modifying digital representations of workpieces in a manufacturing or design system. The problem addressed is the need to efficiently update and manage multiple instances of workpiece models, particularly when changes are required to one or more of these instances. The method involves maintaining a first set of instances of a workpiece model, where each instance represents a digital representation of a physical workpiece. The method allows for changing one of these instances by altering its workpiece model to a different shape, while preserving the integrity of the remaining instances. This change can involve modifying geometric parameters, dimensions, or other defining characteristics of the workpiece model. The method ensures that the updated instance retains compatibility with the overall system, including any dependencies or relationships with other components or processes. The invention is particularly useful in scenarios where multiple variations of a workpiece are needed, such as in custom manufacturing, prototyping, or design iterations, where maintaining consistency and traceability of changes is critical. The approach streamlines the modification process, reducing errors and improving efficiency in managing workpiece models across different stages of production or design workflows.
5. The method of claim 1 , comprising: changing the one or more illumination sources so as to generate a second set of one or more illumination sources, each of the second set of one or more illumination sources having an associated lighting model and light mapping; generating a corresponding changed simulated image based on the one or more lighting models and the one or more light mappings associated with the second set of one or more illumination sources, the first workpiece model, and the first material mapping; repeatedly performing, for a predetermined number of times: receiving, by the processor, an input defining a respective region of interest in the changed simulated image for the computer vision application to search for the feature corresponding to the attribute; and determining, by the processor utilizing the computer vision application, whether the feature corresponding to the attribute of the workpiece is identifiable, in the region of interest in the changed simulated image; calculating, by the processor, a second evaluation score for the design of the configurable inspection station based on the number of times the computer vision application determined the feature corresponding to the attribute of the workpiece was identifiable in the regions of interest in the changed simulated image; and selecting the design of the configurable inspection station based on a comparison of the first evaluation score and the second evaluation score.
This invention relates to optimizing the design of a configurable inspection station for computer vision-based workpiece inspection. The system addresses the challenge of ensuring reliable feature detection under varying lighting conditions by simulating and evaluating different illumination configurations. The method involves generating a simulated image of a workpiece using a first set of illumination sources, each with an associated lighting model and light mapping. A computer vision application searches for a specific feature in the simulated image, and an evaluation score is calculated based on the application's ability to identify the feature. The illumination sources are then adjusted to create a second set, and a new simulated image is generated using the updated lighting models and mappings. The computer vision application repeatedly searches for the feature in different regions of interest within the new simulated image, and another evaluation score is calculated. The inspection station design is selected by comparing the scores from the first and second illumination configurations. This iterative process ensures the optimal lighting setup for reliable feature detection in the inspection station.
6. The method of claim 5 , wherein changing the one or more illumination sources comprises at least one of: replacing a first particular one of the first set of one or more illumination sources with a different illumination source, adding an additional illumination source to the first set of one or more illumination sources, or removing a second particular one of the first set of one or more illumination sources.
This invention relates to systems for dynamically adjusting illumination sources in a lighting setup to optimize performance. The problem addressed is the need to modify illumination sources in real-time to adapt to changing conditions, such as varying lighting requirements, energy efficiency needs, or environmental factors. The invention provides a method for altering a set of illumination sources by either replacing one or more existing sources with different ones, adding new sources to the set, or removing certain sources from the set. The adjustments are made to improve lighting quality, efficiency, or other performance metrics. The method ensures that the modifications are implemented in a controlled manner to maintain desired lighting characteristics while adapting to new conditions. This approach allows for flexible and responsive lighting solutions that can be tailored to specific applications, such as industrial, commercial, or residential environments, where lighting demands may vary over time. The invention enables dynamic reconfiguration of illumination sources without requiring a complete overhaul of the lighting system, thereby enhancing adaptability and cost-effectiveness.
7. The method of claim 1 , further comprising: changing a particular one of the respective one or more light mappings so as to generate a changed set of one or more light mappings; generating a corresponding changed simulated image based on the one or more lighting models, the changed set of one or more light mappings, the first workpiece model, and the first material mapping; repeatedly performing, for a predetermined number of times: receiving, by the processor, an input defining a respective region of interest in the changed simulated image for the computer vision application to search for the feature corresponding to the attribute; and determining, by the processor utilizing the computer vision application, whether the feature corresponding to the attribute of the workpiece is identifiable, in the region of interest in the changed simulated image; calculating, by the processor, a second evaluation score for the design of the configurable inspection station based on the number of times the computer vision application determined the feature corresponding to the attribute of the workpiece was identifiable in the regions of interest in the changed simulated image; and selecting the design of the configurable inspection station based on a comparison of the first evaluation score and the second evaluation score.
This invention relates to optimizing the design of a configurable inspection station for computer vision-based feature detection in workpieces. The problem addressed is ensuring that the inspection station's lighting configuration reliably identifies specific features of a workpiece, such as defects or attributes, using computer vision algorithms. The system simulates the inspection process by generating a simulated image of a workpiece based on a workpiece model, a material mapping, and one or more lighting models. The lighting configuration is adjusted by modifying light mappings, which define the position, intensity, or other properties of light sources. For each adjusted lighting configuration, the system generates a new simulated image and repeatedly tests whether a computer vision application can detect a target feature in predefined regions of interest within the image. The system evaluates the effectiveness of each lighting configuration by calculating an evaluation score based on the number of successful detections. The optimal design of the inspection station is selected by comparing evaluation scores from different lighting configurations. This approach ensures that the chosen configuration maximizes the reliability of feature detection in the actual inspection process.
8. The method of claim 1 , further comprising: receiving a second workpiece model having at least one change from the first workpiece model; generating a corresponding changed simulated image based on the respective one or more lighting models, the respective one or more light mappings, the second workpiece model, and the first material mapping; repeatedly performing, for a predetermined number of times: receiving, by the processor, an input defining a respective region of interest in the changed simulated image for the computer vision application to search for the feature corresponding to the attribute; and determining, by the processor utilizing the computer vision application, whether the feature corresponding to the attribute of the workpiece is identifiable, in the region of interest in the changed simulated image; calculating, by the processor, a second evaluation score for the design of the configurable inspection station based on the number of times the computer vision application determined the feature corresponding to the attribute of the workpiece was identifiable in the regions of interest in the changed simulated image; and selecting the design of the configurable inspection station based on a comparison of the first evaluation score and the second evaluation score.
This invention relates to a method for optimizing the design of a configurable inspection station used in computer vision-based quality control for manufactured workpieces. The method addresses the challenge of ensuring that a computer vision system can reliably detect specific features of a workpiece under varying conditions, such as changes in the workpiece model or lighting configurations. The method begins by generating a simulated image of a workpiece using a first workpiece model, one or more lighting models, and a material mapping that defines the workpiece's surface properties. A computer vision application then searches for a predefined feature in the simulated image, and an evaluation score is calculated based on the system's ability to identify the feature. If the workpiece model is modified, a new simulated image is generated using the updated model while retaining the same lighting and material mappings. The computer vision application repeatedly searches for the feature in different regions of interest within the new simulated image, and a second evaluation score is calculated based on the detection success rate. The inspection station design is then selected by comparing the first and second evaluation scores, ensuring optimal performance for both the original and modified workpiece designs. This approach allows for iterative testing and refinement of inspection station configurations to maintain high accuracy in feature detection despite changes in the workpiece.
9. The method of claim 1 , wherein the attribute of the workpiece comprises one of a geometric feature, an edge, a two-dimensional logo, a three-dimensional logo, a corner or a surface section of the workpiece.
This invention relates to a method for processing a workpiece, specifically focusing on identifying and manipulating specific attributes of the workpiece. The method involves detecting and analyzing attributes such as geometric features, edges, two-dimensional or three-dimensional logos, corners, or surface sections of the workpiece. These attributes are used to guide further processing steps, such as cutting, shaping, or marking the workpiece with high precision. The method ensures accurate alignment and manipulation of the workpiece by leveraging these detected attributes, which can be physical or visual characteristics. The approach is particularly useful in manufacturing and fabrication processes where precise control over workpiece features is required. By identifying and utilizing these attributes, the method enhances the efficiency and accuracy of workpiece processing, reducing errors and improving product quality. The technique can be applied in various industries, including automotive, aerospace, and electronics, where precise manipulation of workpieces is critical. The method may involve automated systems or manual operations, depending on the application, and can be integrated into existing production lines for seamless implementation.
10. The method of claim 1 , further comprising: providing a mechanical layout model assembly of the configurable inspection station to the image rendering application.
This invention relates to a configurable inspection station for visualizing and analyzing mechanical layouts. The system addresses the challenge of efficiently designing and validating inspection setups by integrating a mechanical layout model assembly with an image rendering application. The method involves generating a three-dimensional (3D) model of the inspection station, including components such as sensors, lighting, and positioning mechanisms, and then rendering this model in a virtual environment. The rendered model allows users to simulate the inspection process, adjust parameters, and verify the layout before physical implementation. The mechanical layout model assembly includes detailed representations of the station's components, their spatial relationships, and functional interactions. By providing this model to the image rendering application, the system enables real-time visualization of the inspection station's performance under different configurations. This approach improves design accuracy, reduces prototyping costs, and enhances the efficiency of inspection system development. The invention is particularly useful in manufacturing, quality control, and automated inspection applications where precise layout planning is critical.
11. The method of claim 10 , wherein the mechanical layout model assembly comprises one or more of: a camera model, the first workpiece model, a fixture model, or the respective one or more lighting models.
This invention relates to a method for generating a mechanical layout model assembly used in automated inspection systems, particularly for verifying the accuracy of workpiece measurements. The method addresses the challenge of ensuring precise alignment and positioning of components in inspection setups, which is critical for accurate measurement and quality control in manufacturing. The mechanical layout model assembly includes a camera model representing the imaging device used for inspection, a first workpiece model representing the object being inspected, a fixture model representing the holding or positioning device for the workpiece, and one or more lighting models representing the illumination sources used during inspection. These models are combined to create a virtual representation of the inspection setup, allowing for simulation and optimization of component placement before physical implementation. The method ensures that the camera, workpiece, fixture, and lighting are correctly positioned relative to one another, minimizing errors in measurement and improving inspection accuracy. This approach is particularly useful in automated inspection systems where precise alignment is essential for reliable results.
12. The method of claim 1 , wherein each of the respective one or more light mappings comprises empirically determined data for the corresponding illumination source.
This invention relates to a method for optimizing illumination in a system using multiple light sources. The problem addressed is the need for precise and efficient control of illumination sources to achieve desired lighting effects, particularly in applications where empirical data can improve performance. The method involves generating one or more light mappings for each illumination source in the system. Each light mapping contains empirically determined data specific to the corresponding illumination source. This data may include measurements of light output, color characteristics, or other performance metrics obtained through testing or calibration. By using empirically derived data, the method ensures that the illumination sources are controlled with high accuracy, compensating for variations in manufacturing or environmental factors. The method further includes applying these light mappings to adjust the operation of the illumination sources. This adjustment may involve modifying intensity, color, or other parameters to achieve a desired lighting effect. The use of empirical data allows for fine-tuned control, improving consistency and performance across different sources. Additionally, the method may involve dynamically updating the light mappings based on new empirical data, ensuring continuous optimization of the illumination system. This adaptability is particularly useful in applications where lighting conditions or source characteristics change over time. The overall approach enhances precision, efficiency, and reliability in illumination control systems.
13. The method of claim 1 , wherein the first material mapping comprises empirically determined data.
This invention relates to a method for material mapping in a manufacturing or design process, addressing the challenge of accurately correlating material properties with their performance in real-world applications. The method involves creating a first material mapping that includes empirically determined data, meaning the mapping is based on experimental measurements or observed results rather than theoretical calculations alone. This empirical approach ensures that the material properties used in the mapping are validated through practical testing, improving reliability. The first material mapping is used to define relationships between material characteristics and their behavior under specific conditions, such as stress, temperature, or environmental exposure. By incorporating empirical data, the method reduces inaccuracies that may arise from assumptions or simulations, leading to more precise material selection and optimization. This is particularly useful in industries like aerospace, automotive, or electronics, where material performance directly impacts product durability and safety. The method may also involve generating a second material mapping, which could be based on computational models or simulations, to compare or refine the empirical data. The combination of empirical and theoretical approaches allows for a comprehensive understanding of material behavior, enabling better decision-making in design and manufacturing processes. The overall goal is to enhance material efficiency, reduce costs, and improve product performance by leveraging real-world data.
14. A system for evaluating a design of a configurable inspection station for inspecting a workpiece, the design of the configurable inspection station having a plurality of parameters, the system comprising: a memory storing executable instructions; and a processor in communication with the memory, wherein the processor when executing the executable instructions is configured to: receive from an image rendering application a simulated image based on a respective lighting model for each of a first set of one or more illumination sources of the configurable inspection station; a respective light mapping for each of the one or more lighting models of the configurable inspection station; a first workpiece model; and a first material mapping; define a feature corresponding to an attribute of the workpiece to be searched for in the simulated image by a computer vision application in communication with the image rendering application; repeatedly perform, for a predetermined number of times: receive an input defining a respective region of interest in the simulated image for the computer vision application to search for the attribute; and determine, utilizing the computer vision application, whether the feature corresponding to the attribute of the workpiece is identifiable, in the region of interest in the simulated image; and calculate a first evaluation score for the design of the configurable inspection station based on the number of times the computer vision application determined the feature corresponding to the attribute of the workpiece was identifiable in the regions of interest in the simulated image.
The system evaluates the design of a configurable inspection station used for inspecting workpieces. The inspection station design includes multiple adjustable parameters, such as lighting models for illumination sources, light mappings, workpiece models, and material mappings. The system simulates images of a workpiece under these conditions using an image rendering application. A computer vision application then analyzes these simulated images to detect predefined features of the workpiece, such as surface defects or geometric attributes. The system repeatedly tests different regions of interest within the simulated images to determine if the computer vision application can reliably identify the specified feature. The evaluation score for the inspection station design is calculated based on the frequency of successful feature detection across the tested regions. This process helps optimize the inspection station's configuration to improve detection accuracy before physical implementation. The system automates the assessment of inspection station designs, reducing trial-and-error in setup and ensuring consistent performance in identifying workpiece attributes.
15. The system of claim 14 , wherein the plurality of parameters comprise workpiece and illumination parameters and the respective lighting model for each of the first set of one or more illumination sources, the respective light mapping for each of the one or more lighting models, the first workpiece model and the first material mapping define a first set of instances for the workpiece and the illumination parameter; and when executing the executable instructions the processor is configured to: receive from the image rendering application, a changed simulated image based on a second set of instances for the workpiece and illumination parameters; wherein one of the first set of instances is changed so as to generate the second set of instances for the workpiece and illumination parameters; repeatedly performing, for a predetermined number of times: receive an input defining a respective region of interest in the changed simulated image for the computer vision application to search for the feature corresponding to the attribute; and determine, utilizing the computer vision application, whether the feature corresponding to the attribute of the workpiece is identifiable, in the region of interest in the changed simulated image; calculate a second evaluation score for the design of the configurable inspection station based on the number of times the computer vision application determined the feature corresponding to the attribute of the workpiece was identifiable in the regions of interest in the changed simulated image; and select the design of the configurable inspection station based on a comparison of the first evaluation score and the second evaluation score.
This invention relates to a system for optimizing the design of a configurable inspection station used in computer vision-based workpiece inspection. The system addresses the challenge of ensuring reliable feature detection in varying illumination and workpiece conditions by simulating different configurations and evaluating their performance. The system includes a processor executing instructions to simulate a workpiece inspection process. It uses a first set of parameters, including workpiece and illumination parameters, lighting models for illumination sources, light mappings, a workpiece model, and material mappings, to define initial simulation instances. The system generates a simulated image of the workpiece under these conditions. When a user modifies these parameters to create a second set of instances, the system repeatedly tests the computer vision application's ability to detect a specific feature in designated regions of interest within the changed simulated image. The system calculates an evaluation score based on the number of successful detections and compares it to a baseline score from the initial configuration. The design of the inspection station is then selected based on which configuration yields the higher evaluation score, ensuring optimal feature detection performance. This iterative process helps refine the inspection station's design for improved reliability in real-world applications.
16. The system of claim 15 , wherein to change one of the first set of instances comprises changing a first light mapping for one illumination source to a second light mapping having a different light intensity.
A system for dynamically adjusting lighting configurations in a display environment addresses the challenge of optimizing visual output for different content types or user preferences. The system includes a display device with multiple illumination sources, each capable of emitting light at varying intensities and wavelengths. A controller manages these sources by applying light mappings, which define the intensity and spectral characteristics of each source to achieve desired visual effects. The system further includes a user interface for selecting or adjusting these mappings based on content type, ambient conditions, or user input. The system can modify one or more illumination sources by changing their light mappings. For example, a first light mapping for an illumination source can be replaced with a second light mapping that alters the light intensity while maintaining or adjusting other parameters like color temperature or spectral distribution. This adjustment allows the system to adapt to different display scenarios, such as enhancing contrast for high-dynamic-range content or reducing eye strain for prolonged viewing. The system may also include sensors to detect environmental conditions, enabling automatic adjustments to maintain optimal viewing quality. The dynamic reconfiguration of light mappings ensures flexibility in achieving desired visual performance without requiring hardware changes.
17. The system of claim 15 , wherein to change one of the first set of instances comprises changing a first workpiece model to a second workpiece model having a different shape.
This invention relates to a system for managing and modifying digital representations of workpieces in a manufacturing or design environment. The system addresses the challenge of efficiently updating and tracking changes to workpiece models, particularly when multiple instances of a workpiece are used across different projects or configurations. The system includes a database storing a first set of instances of a workpiece model, where each instance represents a digital representation of a physical workpiece. The system is configured to change one of the instances in the first set by modifying the workpiece model itself. Specifically, the system can replace a first workpiece model with a second workpiece model, where the second model has a different shape than the first. This change is propagated to all instances derived from the original model, ensuring consistency across the system. The system may also include a user interface for selecting and modifying workpiece models, as well as a version control mechanism to track changes over time. The invention improves efficiency by centralizing model management and reducing redundant updates.
18. The system of claim 14 , wherein when executing the executable instructions the processor is configured to: receive from the image rendering application, a changed simulated image, wherein the one or more illumination sources are changed so as to generate a second set of one or more illumination sources, each of the second set of one or more illumination sources having an associated lighting model and associated light mapping; and the changed simulated image is based on the one or more lighting models and the one or more light mappings associated with the second set of one or more illumination sources, the first workpiece model, and the first material mapping; repeatedly performing, for a predetermined number of times: receive an input defining a respective region of interest in the changed simulated image for the computer vision application to search for the feature corresponding to the attribute; and determine, utilizing the computer vision application, whether the feature corresponding to the attribute of the workpiece is identifiable, in the region of interest in the changed simulated image; calculate, a second evaluation score for the design of the configurable inspection station based on the number of times the computer vision application determined the feature corresponding to the attribute of the workpiece was identifiable in the regions of interest in the changed simulated image; and select the design of the configurable inspection station based on a comparison of the first evaluation score and the second evaluation score.
This invention relates to a system for optimizing the design of a configurable inspection station used in computer vision-based workpiece inspection. The system addresses the challenge of ensuring that features of a workpiece, such as edges, textures, or defects, are reliably detectable by a computer vision application under varying illumination conditions. The system simulates different lighting configurations to evaluate their effectiveness in making workpiece features identifiable. The system generates a simulated image of a workpiece model using an initial set of illumination sources, each with an associated lighting model and light mapping. A computer vision application searches predefined regions of interest in the simulated image to determine if a feature of the workpiece is detectable. The system calculates an evaluation score based on the number of successful detections. The illumination sources are then adjusted to create a new set, and the process is repeated with the updated simulated image. The system compares the evaluation scores from the different lighting configurations and selects the design that maximizes feature detectability. This iterative approach ensures that the inspection station is optimized for reliable feature detection under the most effective lighting conditions.
19. The system of claim 18 , wherein the change to the one or more illumination sources comprises at least one of: replacing a first particular one of the first set of one or more illumination sources with a different illumination source, adding an additional illumination source to the first set of one or more illumination sources, or removing a second particular one of the first set of one or more illumination sources.
This invention relates to an illumination system for adjusting light sources to optimize performance. The system includes a first set of one or more illumination sources and a second set of one or more illumination sources, where the second set is configured to provide illumination in response to a change in the first set. The change to the first set may involve replacing a specific illumination source with a different one, adding a new illumination source, or removing an existing one. The system also includes a controller that detects a change in the first set and adjusts the second set accordingly to maintain desired illumination conditions. The adjustment may involve modifying the intensity, color, or other properties of the second set's illumination sources. This system is useful in applications where dynamic adjustments to lighting are needed, such as in display technologies, medical imaging, or industrial inspection, where maintaining consistent illumination is critical. The invention ensures that changes in the first set of illumination sources do not disrupt the overall system performance by automatically compensating with the second set.
20. The system of claim 14 , wherein when executing the executable instructions the processor is configured to: receive from the image rendering application, a changed simulated image based on the respective one or more lighting models, a changed set of one or more light mappings comprising a change to a particular one of the respective one or more light mappings, the first workpiece model, and the first material mapping; repeatedly performing, for a predetermined number of times: receive an input defining a respective region of interest in the changed simulated image for the computer vision application to search for the feature corresponding to the attribute; and determine, utilizing the computer vision application, whether the feature corresponding to the attribute of the workpiece is identifiable, in the region of interest in the changed simulated image; calculate a second evaluation score for the design of the configurable inspection station based on the number of times the computer vision application determined the feature corresponding to the attribute of the workpiece was identifiable in the regions of interest in the changed simulated image; and select the design of the configurable inspection station based on a comparison of the first evaluation score and the second evaluation score.
The system optimizes the design of a configurable inspection station for computer vision-based feature detection in manufactured workpieces. The system addresses challenges in ensuring reliable feature identification under varying lighting conditions and material properties. It receives a simulated image from an image rendering application, which is generated using lighting models, light mappings, a workpiece model, and a material mapping. The system allows for adjustments to these parameters, including changes to specific light mappings, to simulate different inspection scenarios. For each adjusted simulation, the system repeatedly defines regions of interest in the simulated image where a computer vision application searches for a specific feature of the workpiece. The system evaluates whether the feature is identifiable in these regions and calculates an evaluation score based on the detection success rate. This score is compared to a baseline score from a previous simulation to determine the optimal design of the inspection station. The system iterates this process to refine the design, ensuring robust feature detection under varying conditions. The approach improves inspection accuracy by dynamically adapting lighting and material parameters to enhance feature visibility for computer vision algorithms.
21. The system of claim 14 , wherein when executing the executable instructions the processor is configured to: receive from the image rendering application, a changed simulated image based on the one or more lighting models, the respective one or more light mappings, a second workpiece model comprising at least one change from the first workpiece model, and the first material mapping; repeatedly performing, for a predetermined number of times: receive an input defining a respective region of interest in the changed simulated image for the computer vision application to search for the feature corresponding to the attribute; and determine, utilizing the computer vision application, whether the feature corresponding to the attribute of the workpiece is identifiable, in the region of interest in the changed simulated image; calculate a second evaluation score for the design of the configurable inspection station based on the number of times the computer vision application determined the feature corresponding to the attribute of the workpiece was identifiable in the regions of interest in the changed simulated image; and select the design of the configurable inspection station based on a comparison of the first evaluation score and the second evaluation score.
The invention relates to a system for optimizing the design of a configurable inspection station used in computer vision-based quality control. The system addresses the challenge of ensuring that features of a workpiece can be reliably detected by a computer vision application under varying lighting conditions and workpiece configurations. The system simulates different lighting models and material mappings to generate a simulated image of the workpiece. It then evaluates the effectiveness of the inspection station design by repeatedly testing whether a feature of interest is identifiable in specified regions of the simulated image. The system adjusts the workpiece model to reflect changes and re-evaluates the inspection station's performance. It calculates an evaluation score based on the number of successful detections and selects the optimal design by comparing scores from different configurations. This iterative process ensures that the inspection station is optimized for accurate feature detection, improving manufacturing quality control.
22. The system of claim 14 , wherein the attribute of the workpiece comprises one of a geometric feature, an edge, a two-dimensional logo, a three-dimensional logo, a corner or a surface section of the workpiece.
The invention relates to a system for processing workpieces, particularly for identifying and manipulating specific attributes of the workpiece. The system is designed to address challenges in accurately detecting and working with various features of a workpiece, such as geometric features, edges, logos (both two-dimensional and three-dimensional), corners, or surface sections. These attributes are critical for precise manufacturing, quality control, and customization processes. The system likely includes sensors or imaging devices to capture data about the workpiece, along with processing components to analyze and interpret this data. The system may also incorporate robotic or automated tools to perform operations based on the identified attributes, such as cutting, engraving, or marking. By accurately detecting and working with these features, the system enhances precision and efficiency in manufacturing workflows, reducing errors and improving product consistency. The invention is particularly useful in industries where detailed and accurate workpiece processing is essential, such as automotive, aerospace, and electronics manufacturing.
23. The system of claim 14 , wherein when executing the executable instructions the processor is configured to: provide a mechanical layout model assembly of the configurable inspection station to the image rendering application.
This invention relates to a configurable inspection station system designed for automated visual inspection tasks. The system addresses the challenge of efficiently configuring and visualizing inspection setups in industrial or manufacturing environments, where precise alignment of components and accurate imaging are critical. The system includes a processor executing instructions to generate a mechanical layout model assembly of the configurable inspection station. This model assembly is provided to an image rendering application, enabling users to visualize the physical arrangement of inspection components such as cameras, lighting, and fixtures. The system dynamically adjusts the model based on user inputs or predefined configurations, ensuring accurate representation of the inspection setup before physical implementation. The image rendering application processes the model to generate realistic visualizations, aiding in design validation and troubleshooting. The system may also integrate with simulation tools to predict inspection performance, reducing setup time and errors. The invention improves efficiency in inspection system design by providing a virtual representation that facilitates planning and optimization before physical deployment.
24. The system of claim 23 , wherein the mechanical layout model assembly comprises one or more of: a camera model, the workpiece model, a fixture model, or the one or more lighting models.
This invention relates to a system for simulating and optimizing the mechanical layout of components in a machine vision inspection setup. The system addresses the challenge of efficiently designing and configuring inspection systems by providing a virtual environment to model and test different arrangements of components before physical implementation. The mechanical layout model assembly includes a camera model to simulate the imaging device, a workpiece model representing the object being inspected, a fixture model to simulate the holding or positioning mechanism, and one or more lighting models to simulate illumination sources. These models interact within the system to evaluate the effectiveness of different configurations, such as camera angles, lighting positions, and workpiece orientations, to ensure optimal inspection accuracy and efficiency. The system allows users to adjust parameters and visualize the impact on inspection performance, reducing trial-and-error in physical setups and improving overall system design.
25. The system of claim 14 , wherein each of the respective one or more light mappings comprises empirically determined data for the corresponding illumination source.
This invention relates to a lighting system that uses empirically determined data to optimize illumination. The system includes multiple illumination sources, each with one or more light mappings that define how the source should operate under different conditions. These mappings are based on empirical data, meaning they are derived from real-world measurements and testing rather than theoretical calculations alone. The system dynamically adjusts the illumination sources according to these mappings to achieve desired lighting effects, such as color accuracy, brightness, or energy efficiency. The empirical data may include measurements of light output, spectral distribution, or environmental factors like temperature or humidity, ensuring the system performs reliably in practical applications. By using pre-determined mappings, the system avoids real-time calculations, reducing processing overhead and improving responsiveness. This approach is particularly useful in applications where precise lighting control is critical, such as medical imaging, display technologies, or industrial automation. The system may also include feedback mechanisms to refine the mappings over time, further enhancing performance. The invention addresses the challenge of achieving consistent and accurate illumination in environments where theoretical models alone may not account for real-world variations.
26. The system of claim 14 , wherein the first material mapping comprises empirically determined data.
This invention relates to a system for material mapping in manufacturing or design applications, addressing the challenge of accurately correlating material properties with their physical or simulated behavior. The system includes a material mapping module that generates a first material mapping by processing input data, such as material properties or environmental conditions, to predict how a material will perform under specific conditions. The system also includes a simulation module that applies this mapping to a digital model of a product or component, enabling real-time adjustments to material selection or design parameters. The first material mapping is based on empirically determined data, meaning it is derived from experimental measurements or observed performance rather than purely theoretical models. This empirical approach improves accuracy by accounting for real-world variations in material behavior. The system may also include a user interface for visualizing the mapping results and a feedback loop to refine the mapping over time. The invention is particularly useful in industries like aerospace, automotive, or construction, where precise material performance predictions are critical for safety and efficiency.
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October 6, 2020
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