Legal claims defining the scope of protection, as filed with the USPTO.
1. An array substrate, comprising: an enable signal input terminal for inputting an enable signal during test of a panel; a preset electric potential input terminal for inputting a preset electric potential during test of the panel; a connection resistor connected to the enable signal input terminal and the preset electric potential input terminal, wherein a resistance value of the connection resistor is a predetermined multiple of a resistance value of the enable signal input terminal.
2. The array substrate as claimed in claim 1 , wherein material of the connection resistor is polycrystalline silicon.
3. The array substrate as claimed in claim 1 , wherein material of the connection resistor is a wide band gap material.
4. The array substrate as claimed in claim 1 , wherein the resistance value of the connection resistor is greater than or equal to 400 times the resistance value of the enable signal input terminal.
5. The array substrate as claimed in claim 1 , wherein a shape of the connection resistor is at least one of a circular shape, a rectangular shape, or a wave shape.
6. The array substrate as claimed in claim 1 , wherein the connection resistor and an active layer of the array substrate are disposed on a same layer.
7. The array substrate as claimed in claim 1 , wherein the connection resistor is disposed on a surface of the array substrate, and connected to the enable signal input terminal and the preset electric potential input terminal through vias.
8. The array substrate as claimed in claim 1 , wherein the enable signal input terminal comprises at least one of an array substrate testing terminal or a display panel testing terminal.
9. The array substrate as claimed in claim 8 , wherein the connection resistor comprises a first connection resistor and a second connection resistor; the first connection resistor is connected to the array substrate testing terminal and the preset electric potential input terminal; and the second connection resistor is connected to the display panel testing terminal and the preset electric potential input terminal.
10. The array substrate as claimed in claim 9 , wherein the array substrate testing terminal and the display panel testing terminal are disposed on a same layer.
11. A display panel, comprising: an array substrate, and the array substrate comprising: an enable signal input terminal for inputting an enable signal during test of a panel; a preset electric potential input terminal for inputting a preset electric potential during test of the panel; a connection resistor connected to the enable signal input terminal and the preset electric potential input terminal, wherein a resistance value of the connection resistor is a predetermined multiple of a resistance value of the enable signal input terminal.
12. The display panel as claimed in claim 11 , wherein material of the connection resistor is polycrystalline silicon.
13. The display panel as claimed in claim 11 , wherein material of the connection resistor is a wide band gap material.
14. The display panel as claimed in claim 11 , wherein the resistance value of the connection resistor is greater than or equal to 400 times the resistance value of the enable signal input terminal.
15. The display panel as claimed in claim 11 , wherein a shape of the connection resistor is at least one of a circular shape, a rectangular shape, or a wave shape.
16. The display panel as claimed in claim 11 , wherein the connection resistor and an active layer of the array substrate are disposed on a same layer.
17. The display panel as claimed in claim 11 , wherein the connection resistor is disposed on a surface of the array substrate, and connected to the enable signal input terminal and the preset electric potential input terminal through vias.
18. The display panel as claimed in claim 11 , wherein the enable signal input terminal comprises at least one of an array substrate testing terminal or a display panel testing terminal.
19. The display panel as claimed in claim 18 , wherein the connection resistor comprises a first connection resistor and a second connection resistor; the first connection resistor is connected to the array substrate testing terminal and the preset electric potential input terminal; and the second connection resistor is connected to the display panel testing terminal and the preset electric potential input terminal.
20. The display panel as claimed in claim 19 , wherein the array substrate testing terminal and the display panel testing terminal are disposed on a same layer.
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June 22, 2021
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