11468964

Repair Circuit of Memory and Method Thereof

PublishedOctober 11, 2022
Assigneenot available in USPTO data we have
InventorsCHIN-HSI LIN
Technical Abstract

Patent Claims
22 claims

Legal claims defining the scope of protection, as filed with the USPTO.

2

2. The repair method according to claim 1, wherein said plurality of general bits and said plurality of redundancy bits are on an identical row.

3

3. The repair method according to claim 1, further comprising connecting said plurality of general bit and said plurality of redundancy bits to a register before executing said step (A) and said step (B).

5

5. The repair method according to claim 1, wherein said step (B) comprises dividing good redundancy bits in said plurality of redundancy bits into said plurality of second groups.

6

6. The repair method according to claim 1, wherein said step (D) includes while an Mth first group of said plurality of first groups has a defective bit, selecting one of said plurality of second groups to replace said Mth first group according to first repair data corresponding to from a 1st first group of said plurality of first groups to said Mth first group, wherein M is an integer greater than zero.

7

7. The repair method according to claim 1, wherein said step (D) includes while an Mth first group of said plurality of first groups has a defective bit, selecting one of said plurality of second groups to replace said Mth first group according to an Mth first repair data of said plurality of first repair data, which is corresponding to said Mth first group, wherein M is an integer greater than zero.

8

8. The repair method according to claim 7, wherein said Mth first repair data includes information of a second group to be selected.

9

9. The repair method according to claim 7, further comprising decoding said Mth first repair data to generate a selection signal to select one of said plurality of second groups for replacing said Mth first group.

11

11. The repair method according to claim 10, wherein said plurality of general bits and said plurality of redundancy bits are on an identical row.

13

13. The repair method according to claim 10, wherein said step (B) further comprises dividing good redundancy bits in said plurality of redundancy bits into said plurality of second groups.

14

14. The repair method according to claim 10, wherein said step (D) includes while an Mth first group of said plurality of first groups has a defective bit, selecting one of said plurality of second groups B to replace said Mth first group according to first repair data corresponding to from a 1st first group of said plurality of first groups to said Mth first group, wherein M is an integer greater than zero.

15

15. The repair method according to claim 10, wherein said step (D) includes while an Mth first group of said plurality of first groups has a defective bit, selecting one of said plurality of second groups to replace said Mth first group according to an Mth first repair data of said plurality of first repair data, which is corresponding to said Mth first group, wherein M is an integer greater than zero.

16

16. The repair method according to claim 15, wherein said Mth first repair data includes information of a second group to be selected.

17

17. The repair method according to claim 15, further comprising decoding said Mth first repair data to generate a selection signal to select one of said plurality of second groups for replacing said Mth first group.

19

19. The repair circuit according to claim 18, wherein said plurality of general bits and said plurality of redundancy bits are on an identical row.

20

20. The repair circuit according to claim 18, further comprising a register connected to said decoder and configured to connect with said plurality of general bits and said plurality of redundancy bits.

21

21. The repair circuit according to claim 18, wherein said decoder includes a plurality of logic gates.

22

22. The repair circuit according to claim 18, wherein said selection circuit includes a multiplexer.

23

23. The repair circuit according to claim 18, wherein said repair data is provided by said Mth first group.

25

25. The repair circuit according to claim 24, wherein said plurality of general bits and said plurality of redundancy bits are on an identical row.

26

26. The repair circuit according to claim 24, wherein said decoder includes a plurality of logic gates.

27

27. The repair circuit according to claim 24, wherein said selection circuit includes a multiplexer.

28

28. The repair circuit according to claim 24, wherein said repair data is provided by said Mth first group.

Patent Metadata

Filing Date

Unknown

Publication Date

October 11, 2022

Inventors

CHIN-HSI LIN

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