11581053

Memory Device Test Mode Access

PublishedFebruary 14, 2023
Assigneenot available in USPTO data we have
Technical Abstract

Patent Claims
14 claims

Legal claims defining the scope of protection, as filed with the USPTO.

2

2. The system of claim 1, wherein the processing device is configured to communicate with the memory device via signaling in accordance with the particular protocol, and through which the test mode access component is configured to communicate with the memory device.

3

3. The system of claim 2, wherein the system comprises a storage subsystem, and wherein the storage subsystem includes a controller comprising the processing device and the test mode access component.

4

4. The system of claim 2, wherein the second signal is to cause the memory device to perform a fuse identification (FID) read operation.

5

5. The system of claim 2, wherein signaling between the test mode access component and the interface is non-compliant with the particular protocol.

6

6. The system of claim 5, wherein the particular protocol is a double data rate (DDR) JEDEC standard protocol.

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7. The system of claim 1, wherein the test mode access component is configured to cause the memory device to program a register of the memory device to access the memory device.

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8. The system of claim 7, wherein the register comprises a mode register.

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10. The method of claim 9, further comprising retrieving a fuse identification (FID) of a memory die of the memory device by performing the second set of operation on the memory device.

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11. The method of claim 9, wherein performing the second set of operations on the memory device during the test mode comprises programming a mode register of the memory device to access data stored in the memory device.

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12. The method of claim 9, further comprising operating the memory device to perform the first set of operations according to a double data rate (DDR) initialization sequence.

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14. The system of claim 13, wherein the particular interface protocol is a double data rate (DDR) JEDEC standard protocol.

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16. The system of claim 13, wherein the first interface portion is configured to provide the signal compliant with the particular interface protocol via an address bus or a bank address bus.

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17. The system of claim 13, wherein the first interface portion is located within the processing device and comprises an input/output (I/O) pad and a plurality of multiplexers comprising a first multiplexer and a second multiplexer that are coupled to the I/O pad.

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20. The system of claim 13, wherein the memory device is a synchronous dynamic random access memory (SDRAM) device.

Patent Metadata

Filing Date

Unknown

Publication Date

February 14, 2023

Inventors

Michael R. Spica
David G. Springberg

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Cite as: Patentable. “MEMORY DEVICE TEST MODE ACCESS” (11581053). https://patentable.app/patents/11581053

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