11625820

Evaluating an Inspection Algorithm for Inspecting a Semiconductor Specimen

PublishedApril 11, 2023
Assigneenot available in USPTO data we have
InventorsIlya Blayvas
Technical Abstract

Patent Claims
3 claims

Legal claims defining the scope of protection, as filed with the USPTO.

2

2. The method according to claim 1 wherein the images are conveyed to the evaluation unit over one or more local communication paths.

3

3. The method according to claim 1, further comprising receiving, by the evaluation unit, review results of a review process that was applied on at least some of the multiple semiconductor wafers; and wherein the evaluating of the inspection algorithm is based, at least in part, on the review results.

4

4. The method according to claim 1 wherein the storing, the evaluating, and the sending are executed without interrupting an inspection process executed in the production environment of the inspection system.

Patent Metadata

Filing Date

Unknown

Publication Date

April 11, 2023

Inventors

Ilya Blayvas

Want to explore more patents?

Browse 5M+ US patents with plain-English claim translations and AI-generated analysis.

Citation & reuse

Analysis on this page is generated by Patentable — an AI-powered patent intelligence platform. AI-generated summaries, explanations, and analysis may be reused with attribution and a visible link back to the canonical URL below. Patent abstracts and claims are USPTO public domain.

Cite as: Patentable. “EVALUATING AN INSPECTION ALGORITHM FOR INSPECTING A SEMICONDUCTOR SPECIMEN” (11625820). https://patentable.app/patents/11625820

© 2026 Patentable. All rights reserved.

Patentable is a research and drafting-assistant tool, not a law firm, and does not provide legal advice. Documents we generate are drafts for review by a licensed patent attorney.

EVALUATING AN INSPECTION ALGORITHM FOR INSPECTING A SEMICONDUCTOR SPECIMEN — Ilya Blayvas | Patentable