Method and Apparatus for Providing Wear Leveling

2. The method of claim 1, wherein the die region wear-out data is based on operating condition data associated with each of the plurality of die regions accrued over the life of each respective region of the plurality of die regions.

4. The method of claim 1, wherein the operating condition data is based on a plurality of operating characteristics from the group consisting of: the frequency of operation of the plurality of die regions, temperature level of the plurality of die regions, the operating voltage of the plurality of die regions, the activity level of the plurality of die regions, a timing margin of the plurality of die regions, and a number of detected faults of the plurality of die regions.

7. The method of claim 1, further comprising wherein spreading wear among the plurality of die regions includes generating wear-out control data that controls at least one of: remapping of memory addresses for a die region of memory and operation of other functional units in the integrated circuit.

11. The apparatus of claim 10, wherein the wear spreading logic is further operative to accrue the operating condition data over the life of each respective region of the plurality of die regions.

13. The apparatus of claim 10, wherein the operating condition data is based on a plurality of operating characteristics from the group consisting of: the frequency of operation of the plurality of die regions, the operating voltage of the plurality of die regions, the activity level of the plurality of die regions, temperature level of the plurality of die regions, the timing margin of the plurality of die regions, and the number of detected faults of the plurality of die regions.

16. The apparatus of claim 10, wherein the wear spreading logic is further operative to spread wear among the plurality of die regions by generating wear-out control data that controls at least one of: remapping of memory addresses for a die region of memory and operation of other functional units.

19. The apparatus of claim 18, wherein the wear spreading logic is further operative to accrue the operating condition data over the life of each respective region of the plurality of die regions.

21. The apparatus of claim 18, wherein the operating condition data is based on a plurality of operating characteristics from the group consisting of: the frequency of operation of the plurality of die regions, the operating voltage of the plurality of die regions, the activity level of the plurality of die regions, temperature level of the plurality of die regions, the timing margin of the plurality of die regions, and the number of detected faults of the plurality of die regions.

24. The apparatus of claim 18, wherein the wear spreading logic is further operative to spread wear among the plurality of die regions by generating wear-out control data that controls at least one of: remapping of memory addresses for a die region of memory and operation of other functional units.

26. The apparatus of claim 18 wherein the thermal wear spreading logic is operative to produce fault detection information by producing data indicating at least one of: an error rate exceeds a threshold or logic timing delays exceed a threshold.