11774769

Depth Measurement Using a Pulsed Structured Light Projector

PublishedOctober 3, 2023
Assigneenot available in USPTO data we have
InventorsMichael Hall
Technical Abstract

Patent Claims
19 claims

Legal claims defining the scope of protection, as filed with the USPTO.

2

2. The DMA of claim 1, wherein the depth camera assembly comprises a plurality of photodiodes, each photodiode includes a first storage region and a second storage region, photoelectrons corresponding to light captured during an exposure duration of the depth camera assembly are stored in the first storage region, and photoelectrons corresponding to light captured outside the exposure duration of the depth camera assembly are stored in the second storage region.

3

3. The DMA of claim 2, wherein the controller is further configured to subtract image data read out from the second storage region from image data read out from the first storage region.

4

4. The DMA of claim 1, wherein the depth camera assembly comprises a detector configured to collect pulses of structured light reflected from the object in synchronization with projection of the pulses of structured light of the plurality of structured light projectors.

5

5. The DMA of claim 4, wherein the controller is configured to determine the depth information based on phase-shifted patterns of the reflected structured light distorted by shapes of the object.

6

6. The DMA of claim 4, wherein for each pulse of the pulses of structured light projected by the plurality of structured light projectors, the detector is configured to take one or more exposures during an exposure duration that is same as or longer than duration of the pulse.

7

7. The DMA of claim 6, wherein the detector comprises a tunable filter that is inactive during each exposure duration and active outside exposure durations of the detector.

8

8. The DMA of claim 1, wherein the pulses of structured light have a peak power that is greater than a power of ambient light within the local area.

9

9. The DMA of claim 1, wherein the depth instructions include a frequency of the pulses of structured light, and the controller is further configured to determine the frequency based on a threshold amount of heat accumulated in a vicinity of the plurality of structured light projectors during operation of the DMA.

10

10. The DMA of claim 1, wherein the captured image data comprises separate image data for each structured light projector.

11

11. The DMA of claim 1, wherein each structured light projector of the plurality of structured light projectors includes a pulsed illuminator, a diffractive optical element, and a projection assembly.

12

12. The DMA of claim 1, wherein the plurality of structured light projectors alternatively project the respective pulses of structured light.

13

13. The DMA of claim 1, wherein the pulses of structured light have a frequency in a range from 100 kHz to 200 MHz.

14

14. The DMA of claim 1, wherein the pulses of structured light have a pulse duration in a range from 100 ps to 100 ns.

15

15. The DMA of claim 1, wherein the controller is configured to determine the depth information using a ratio of charge between storage regions associated with each photodiode of the depth camera assembly.

16

16. The DMA of claim 1, wherein the controller is further configured to use triangulation calculation to obtain a depth map of the local area.

17

17. The DMA of claim 1, wherein the depth instructions comprise one or more pulse parameters for the plurality of structured light projectors.

18

18. The DMA of claim 17, wherein the one or more pulse parameters include pulse rate, pulse length, pulse wavelength, pulse amplitude, some other parameters that control how the respective pulses of structured light are emitted by the pulsed illuminator assembly, or some combination thereof.

19

19. The DMA of claim 1, wherein the depth instructions comprise an exposure rate and an exposure duration for the depth camera assembly.

20

20. The DMA of claim 1, wherein the respective pulses of structured light projected by each respective structured light projector are formed by interference of two or more beams of pulsed light.

Patent Metadata

Filing Date

Unknown

Publication Date

October 3, 2023

Inventors

Michael Hall

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Cite as: Patentable. “DEPTH MEASUREMENT USING A PULSED STRUCTURED LIGHT PROJECTOR” (11774769). https://patentable.app/patents/11774769

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