Method, Device and System for Testing Memory Devices

5. The method for testing memory devices according to claim 3, wherein the input test parameter comprises an input control signal and an input data signal.

11. The system for testing memory devices according to claim 10, wherein the at least two test seats comprises a first test seat and a second test seat, the first test seat is used for installing of a 78ball Double Data Rate 4 (DDR4) chip, and the second test seat is used for installing of a 96ball DDR4 chip.

12. The system for testing memory devices according to claim 10, the system further comprising a conversion device, the conversion device being electrically connected to the device for testing memory devices, and the conversion device being configured to convert a serial signal of a serial port of the device for testing memory devices to a universal serial bus (USB) signal of a USB interface.

13. The system for testing memory devices according to claim 12, wherein the USB interface comprises a Type-C interface.

14. The system for testing memory devices according to claim 12, the system further comprising a terminal device, the terminal device being electrically connected to the device for testing memory devices through the conversion device, and the terminal device being configured to input test instructions.